Toward Automated Fabric Defect Detection: A Survey of Recent Computer Vision Approaches

Defect detection is a crucial part of the pipeline in many industries. In the textile industry, it is especially important, as it will affect the quality and price of the final product. However, it is mostly performed by human agents, who have been reported to have poor performance, along with requiring a costly and time-consuming training process. As such, methods to automate the process have been increasingly explored throughout the last 20 years. While there are many traditional approaches to this problem, with the advent of deep learning, machine learning-based approaches now constitute the majority of all possible approaches. Other articles have explored traditional approaches and machine learning approaches in a more general way, detailing their evolution over time. In this review, we summarize the most important advancements in the last 5 years and focus mostly on machine learning-based approaches. We also outline the most promising avenues of research in the future.

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Publication Details

Journal
Electronics
Published
2024-09-20
DOI
https://doi.org/10.3390/electronics13183728
Citations
24
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
8.37

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article

Toward Automated Fabric Defect Detection: A Survey of Recent Computer Vision Approaches

Rui Carrilho, Kailash Hambarde, Ehsan Yaghoubi, Hugo Proença et al.
24 citations
Electronics
Industrial Vision Systems and Defect Detection
8.37
article

Toward Automated Fabric Defect Detection: A Survey of Recent Computer Vision Approaches

Rui Carrilho, Kailash Hambarde, Ehsan Yaghoubi, Hugo Proença, José Lindo
article en
24 citations

Abstract

Defect detection is a crucial part of the pipeline in many industries. In the textile industry, it is especially important, as it will affect the quality and price of the final product. However, it is mostly performed by human agents, who have been reported to have poor performance, along with requiring a costly and time-consuming training process. As such, methods to automate the process have been increasingly explored throughout the last 20 years. While there are many traditional approaches to this problem, with the advent of deep learning, machine learning-based approaches now constitute the majority of all possible approaches. Other articles have explored traditional approaches and machine learning approaches in a more general way, detailing their evolution over time. In this review, we summarize the most important advancements in the last 5 years and focus mostly on machine learning-based approaches. We also outline the most promising avenues of research in the future.

ElectronicsVol. 13(18)
Universität Hamburg (DE), University of Beira Interior (PT), Instituto de Telecomunicações (PT)
Ministerio de Economía y Competitividad, Ministério da Ciência, Tecnologia e Ensino Superior, Fundação para a Ciência e a Tecnologia
Openalex Percentile: Top 2%
Industrial Vision Systems and Defect Detection
8.37
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