Investigating the Local Bonding Structure of Amorphous Zinc Tin Oxide to Elucidate the Effect of Altering the Intercation Ratio

In this paper, the local bonding structure in amorphous zinc tin oxide (a-ZTO) is probed using a combination of XANES and EXAFS techniques at the Zn and Sn K-edges to gain insight into charge carrier generation in the material. a-ZTO is prepared using two growth methods; spray pyrolysis and magnetron sputtering. It is seen that a-ZTO grown by magnetron sputtering shows no changes in the chemical environment as the cation ratio is varied; meanwhile, XANES analysis of spray pyrolysis grown samples shows alterations to spectra likely due to the effects caused by different precursors. Although a slight shift in Sn-O bond length is visible between magnetron sputtered and spray grown samples, no correlation could be discerned between bond length and variation in cation ratio. It is concluded that a-ZTO, while amorphous over longer ranges, is locally composed of ZnO and SnO<sub>2</sub> "building blocks". An alteration in the cation ratio changes the hybridization at the conduction band minimum, resulting in the observed variation in the mobility, charge carrier concentration, and bandgap.

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Publication Details

Journal
The Journal of Physical Chemistry C
Published
2024-09-20
DOI
https://doi.org/10.1021/acs.jpcc.4c04225
Citations
1
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
0.21

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article

Investigating the Local Bonding Structure of Amorphous Zinc Tin Oxide to Elucidate the Effect of Altering the Intercation Ratio

Kuanysh Zhussupbekov, I. V. Shvets, David Caffrey, Yurii K. Gun’ko et al.
1 citations
The Journal of Physical Chemistry C
Thin-Film Transistor Technologies
0.21
article

Investigating the Local Bonding Structure of Amorphous Zinc Tin Oxide to Elucidate the Effect of Altering the Intercation Ratio

Kuanysh Zhussupbekov, I. V. Shvets, David Caffrey, Yurii K. Gun’ko, K. Fleischer, P. J. Callaghan, Ainur Zhussupbekova, Stuart Ansell
article en
1 citations

Abstract

In this paper, the local bonding structure in amorphous zinc tin oxide (a-ZTO) is probed using a combination of XANES and EXAFS techniques at the Zn and Sn K-edges to gain insight into charge carrier generation in the material. a-ZTO is prepared using two growth methods; spray pyrolysis and magnetron sputtering. It is seen that a-ZTO grown by magnetron sputtering shows no changes in the chemical environment as the cation ratio is varied; meanwhile, XANES analysis of spray pyrolysis grown samples shows alterations to spectra likely due to the effects caused by different precursors. Although a slight shift in Sn-O bond length is visible between magnetron sputtered and spray grown samples, no correlation could be discerned between bond length and variation in cation ratio. It is concluded that a-ZTO, while amorphous over longer ranges, is locally composed of ZnO and SnO<sub>2</sub> "building blocks". An alteration in the cation ratio changes the hybridization at the conduction band minimum, resulting in the observed variation in the mobility, charge carrier concentration, and bandgap.

The Journal of Physical Chemistry CVol. 128(39)
Trinity College Dublin (IE), MAX IV Laboratory (SE), Dublin City University (IE)
Science Foundation Ireland, Irish Research Council, Engineering and Physical Sciences Research Council
Openalex Percentile: Top 48%
Thin-Film Transistor Technologies
0.21
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