Intergrain scattering in polycrystals

Transport through grain boundaries in polycrystals is described from first principles using quantum scattering theory, explicitly including Feshbach resonances to account for intermittently trapped electronic surface states. An effective<i>T</i>-matrix is derived then used to calculate the electrical conductivity which exhibits breakdown, a sharp increase at a critical intergrain bias. Under typical conditions where the electron thermal energy,kBT, is much less than the intergrain barrier height,φb, the electrical conductivity has the formσ∼T-1/2e-φb/kBT. Temperature dependence of the conductivity is also considered for thermal energies much larger than the applied bias, as may be realized in tightly-compressed grains.

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Publication Details

Journal
Journal of Physics Condensed Matter
Published
2024-09-20
DOI
https://doi.org/10.1088/1361-648x/ad7dc6
Primary Topic
Surface and Thin Film Phenomena
Type
article
Field-Weighted Citation Impact
0.00

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article

Intergrain scattering in polycrystals

George E. Cragg
Journal of Physics Condensed Matter
Surface and Thin Film Phenomena
article

Intergrain scattering in polycrystals

George E. Cragg
article en

Abstract

Transport through grain boundaries in polycrystals is described from first principles using quantum scattering theory, explicitly including Feshbach resonances to account for intermittently trapped electronic surface states. An effective<i>T</i>-matrix is derived then used to calculate the electrical conductivity which exhibits breakdown, a sharp increase at a critical intergrain bias. Under typical conditions where the electron thermal energy,kBT, is much less than the intergrain barrier height,φb, the electrical conductivity has the formσ∼T-1/2e-φb/kBT. Temperature dependence of the conductivity is also considered for thermal energies much larger than the applied bias, as may be realized in tightly-compressed grains.

Journal of Physics Condensed MatterVol. 37(4)
Shell (United States) (US), Shell (Japan) (JP)
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Surface and Thin Film Phenomena
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