Auto thresholds of image multilevel segmentation applying maximum value to construct 2D histogram

It may achieve auto segmentation to construct 2 D histogram utilizing 2 D entropy. Habitual approach practices center gray scale and average scale of points in the same 4 neighbor. Actually, the horizontal or vertical change of the gray scale will not stand for the whole natures among neighbor points also. A maximum value way is constructed to established 2 D histogram by utilizing of center gray value and maximum value of 4 other point gray values except 4 neighbor points in the same 3×3 neighbor. The effects of multi-level experiments to almost all images in Matlab image toolbox manifest the validity of the constructed way.

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Publication Details

Published
2024-09-20
DOI
https://doi.org/10.1117/12.3045823
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
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article

Auto thresholds of image multilevel segmentation applying maximum value to construct 2D histogram

Yunfei Zhang, Xianghong He, Zhan Zhang, Ri Xu et al.
Industrial Vision Systems and Defect Detection
article

Auto thresholds of image multilevel segmentation applying maximum value to construct 2D histogram

Yunfei Zhang, Xianghong He, Zhan Zhang, Ri Xu, Ping Wang
article en

Abstract

It may achieve auto segmentation to construct 2 D histogram utilizing 2 D entropy. Habitual approach practices center gray scale and average scale of points in the same 4 neighbor. Actually, the horizontal or vertical change of the gray scale will not stand for the whole natures among neighbor points also. A maximum value way is constructed to established 2 D histogram by utilizing of center gray value and maximum value of 4 other point gray values except 4 neighbor points in the same 3×3 neighbor. The effects of multi-level experiments to almost all images in Matlab image toolbox manifest the validity of the constructed way.

China Design Group (China) (CN), AviChina Industry & Technology (China) (CN)
Openalex Percentile: Top 78%
Industrial Vision Systems and Defect Detection
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