Novel Integrated Double pMOS SOI-LIGBT With Low Loss and High Short-Circuit Capability
An ultralow loss lateral insulated gate bipolar transistor (LIGBT) with high short-circuit capability is proposed and investigated by simulations. The proposed LIGBT features integrated double pMOS at the cathode side of a conventional LIGBT (Con. LIGBT) (named as IDP LIGBT), wherein pMOS1 is the depletion mode and pMOS2 is the enhancement mode. The potential <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {P}}$ </tex-math></inline-formula>/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {N}}$ </tex-math></inline-formula> of cathode P+/N+ regions are self-adaptively modulated by the pMOS2 and pMOS1. In the<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small>-state, the parasitic diode <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${D}1$ </tex-math></inline-formula> (p-well/cathode N+ region) of IDP LIGBT is turned on to enhance the conductivity modulation effect and then achieve a low<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small>-state voltage drop (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {on}}$ </tex-math></inline-formula>). During the turning off period, the pMOS2 is turned on before the main gate of LIGBT turning off to extract holes from the p-well quickly and decrease the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {P}}$ </tex-math></inline-formula>, which turns off <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${D}1$ </tex-math></inline-formula> and makes less carriers needed to be extracted. Meanwhile, the pMOS1 channel is self-adaptively narrowed and depleted with the increasing <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {AK}}$ </tex-math></inline-formula>, which elevates the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {N}}$ </tex-math></inline-formula> and then reduces the cathode electron injection efficiency. Therefore, the IDP LIGBT achieves an ultrafast switching speed and a low turnoff loss (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {off}}$ </tex-math></inline-formula>). In the short-circuit state with high <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$V_{\text {AK}}$ </tex-math></inline-formula>, the pMOS1 is self-adaptively pinched off to reduce cathode electron injection efficiency and saturation current, so as to achieve a better short-circuit withstanding time (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${t}_{\text {SC}}$ </tex-math></inline-formula>). Compared with the MOS resistor (MR) LIGBT, the IDP LIGBT decreases the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {off}}$ </tex-math></inline-formula>/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {on}}$ </tex-math></inline-formula> by 55%/13% at the same <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {on}}$ </tex-math></inline-formula>/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {off}}$ </tex-math></inline-formula> and improves the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${t}_{\text {SC}}$ </tex-math></inline-formula> by 56%.
Authors
- Jinlong Lu (ORCID: https://orcid.org/0000-0001-9934-9082)
- Kaiwei Dai (ORCID: https://orcid.org/0000-0002-0292-7745)
- Xiaorong Luo
- Pengchen Zhu
- Renkuan Liu (ORCID: https://orcid.org/0000-0001-8443-6925)
- Bo Zhang (ORCID: https://orcid.org/0000-0003-1288-1549)
- Jie Wei (ORCID: https://orcid.org/0000-0002-9587-8611)
- Hui Li (ORCID: https://orcid.org/0000-0002-3565-1773)
- Jialei Tan (ORCID: https://orcid.org/0009-0000-6332-5249)
Institutions
- University of Electronic Science and Technology of China (CN)
- Chongqing University (CN)
- National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2024-09-16
- DOI
- https://doi.org/10.1109/ted.2024.3454035
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- National Natural Science Foundation of China