Development and Evaluation of ANN, RBNNs, and GRNNs Based Small-Signal Behavioral Models for GaN HEMT Up to 40 GHz

This paper conducts an extensive analysis of small-signal behavioral modelling of Gallium Nitride (GaN) High Electron Mobility Transistors (HEMTs) up to 40 GHz, utilizing Artificial Neural Network (ANN), Radial Basis Neural Networks (RBNNs), and Generalized Regression Neural Networks (GRNNs). The study focuses on enhancing accuracy, generalization capability and speed by fine-tuning hyperparameters through standard trial and error method. Additionally, the paper evaluates the developed models' ease of implementation, and fitting and error behaviors under diverse biasing conditions. The acquired results indicate an exceptional consistency between measured and modelled behaviors for ANN based models. Furthermore, RBNNs based models demonstrate subpar accuracy, whereas GRNNs based models exhibit inferior prediction accuracy compared to ANN but better than RBNNs based models.

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Publication Details

Published
2024-08-11
DOI
https://doi.org/10.1109/mwscas60917.2024.10658824
Citations
4
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.24
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article

Development and Evaluation of ANN, RBNNs, and GRNNs Based Small-Signal Behavioral Models for GaN HEMT Up to 40 GHz

Saddam Husain, Galymzhan Nauryzbayev, Mohammad Hashmi, Kashif Khan
4 citations
GaN-based semiconductor devices and materials
1.24
article

Development and Evaluation of ANN, RBNNs, and GRNNs Based Small-Signal Behavioral Models for GaN HEMT Up to 40 GHz

Saddam Husain, Galymzhan Nauryzbayev, Mohammad Hashmi, Kashif Khan
article en
4 citations

Abstract

This paper conducts an extensive analysis of small-signal behavioral modelling of Gallium Nitride (GaN) High Electron Mobility Transistors (HEMTs) up to 40 GHz, utilizing Artificial Neural Network (ANN), Radial Basis Neural Networks (RBNNs), and Generalized Regression Neural Networks (GRNNs). The study focuses on enhancing accuracy, generalization capability and speed by fine-tuning hyperparameters through standard trial and error method. Additionally, the paper evaluates the developed models' ease of implementation, and fitting and error behaviors under diverse biasing conditions. The acquired results indicate an exceptional consistency between measured and modelled behaviors for ANN based models. Furthermore, RBNNs based models demonstrate subpar accuracy, whereas GRNNs based models exhibit inferior prediction accuracy compared to ANN but better than RBNNs based models.

Nazarbayev University (KZ)
Openalex Percentile: Top 21%
GaN-based semiconductor devices and materials
1.24
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