A photovoltaic cell defect detection model capable of topological knowledge extraction
As the global transition towards clean energy accelerates, the demand for the widespread adoption of solar energy continues to rise. However, traditional object detection models prove inadequate for handling photovoltaic cell electroluminescence (EL) images, which are characterized by high levels of noise. To address this challenge, we developed an advanced defect detection model specifically designed for photovoltaic cells, which integrates topological knowledge extraction. Our approach begins with the introduction of a multi-scale dynamic context-based feature extraction method, capable of generating static context by thoroughly capturing the local texture and structural information of multi-scale defects. This static context is then combined with dynamic context to produce fine-grained local features. Subsequently, we developed a centralized feature pyramid structure, enhanced by spatial semantics, which models the explicit visual center. This structure effectively elucidates the relationship between local and global features in defect images, thereby improving the representation of defect characteristics. Finally, we implemented a feature enhancement strategy grounded in spatial semantic knowledge extraction. This strategy uncovers potential correlations among defect targets by constructing a spatial semantic topology of features, mapping these features to a higher-order representation, and ultimately delivering precise defect detection results.
Authors
- Yunchang Dong (ORCID: https://orcid.org/0000-0002-5891-8370)
- Lingcong Li
- Zhaoyang Qu (ORCID: https://orcid.org/0000-0001-7599-9531)
- Xiaoyu Xu (ORCID: https://orcid.org/0000-0002-1580-8905)
- Qi Xu (ORCID: https://orcid.org/0009-0006-3155-2475)
- Jiye Zang
- Kexin Fu
Institutions
- Electric Power University (VN)
- Northeast Electric Power University (CN)
- Jilin Electric Power Research Institute (China) (CN)
Publication Details
- Journal
- Scientific Reports
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1038/s41598-024-72717-0
- Citations
- 7
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 2.44