Amorphous IGZO MIS Phototransistor With HfO<sub>2</sub> Gate Dielectrics for High Sensitivity Solar-Blind Ultraviolet Detection

Amorphous indium-gallium-zinc-oxide (a-IGZO) thin film was deposited by radio frequency sputtering in an oxygen-free atmosphere. The composition of the a-IGZO thin film was adjusted to be In0.2Ga1.8ZnO4 so that the bandgap of the a-IGZO thin film was 4.5 eV for solar-blind ultraviolet photodetectors. Then, the bottom-gate IGZO phototransistor was fabricated with a high-k gate dielectric layer of hafnium oxide (HfO2) to enhance the gate controllability. The phototransistor showed excellent performance with an on/off ratio of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10^{{9}}$ </tex-math></inline-formula> and field-effect mobility of 5.4 cm<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{{2}}\cdot \text {V}^{-{1}}\cdot \text {s}^{-{1}}$ </tex-math></inline-formula>. Under the 255 nm illumination, the phototransistor presented a gate voltage-controlled ultraviolet response. With zero voltage gate bias, a responsivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$3.2\times 10^{{5}}$ </tex-math></inline-formula> AW<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{-{1}}$ </tex-math></inline-formula> and a detectivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.4\times 10^{{16}}$ </tex-math></inline-formula> Jones was obtained. As a phototransistor made from amorphous semiconductors, the response speed is very low. The rise time and decay time are estimated at about 12 s and over 1800 s, respectively. However, the response time was tremendously improved to be less than <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$25~\mu $ </tex-math></inline-formula>s by interleaving both positive and negative gate voltage pulses synchronized with the UV illumination. The synchronous gate voltage pulses can be easily realized in readout integrated circuits (ROICs). Therefore, a-IGZO thin-film phototransistor should be a good candidate for flexible solar-blind ultraviolet photodetector with excellent performance.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-09-19
DOI
https://doi.org/10.1109/ted.2024.3457573
Citations
6
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
0.71

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article

Amorphous IGZO MIS Phototransistor With HfO2 Gate Dielectrics for High Sensitivity Solar-Blind Ultraviolet Detection

Xingzhao Liu, Jichun Yao, Shining Liu
6 citations
IEEE Transactions on Electron Devices
Ga2O3 and related materials
0.71
article

Amorphous IGZO MIS Phototransistor With HfO2 Gate Dielectrics for High Sensitivity Solar-Blind Ultraviolet Detection

Xingzhao Liu, Jichun Yao, Shining Liu
article en
6 citations

Abstract

Amorphous indium-gallium-zinc-oxide (a-IGZO) thin film was deposited by radio frequency sputtering in an oxygen-free atmosphere. The composition of the a-IGZO thin film was adjusted to be In0.2Ga1.8ZnO4 so that the bandgap of the a-IGZO thin film was 4.5 eV for solar-blind ultraviolet photodetectors. Then, the bottom-gate IGZO phototransistor was fabricated with a high-k gate dielectric layer of hafnium oxide (HfO2) to enhance the gate controllability. The phototransistor showed excellent performance with an on/off ratio of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10^{{9}}$ </tex-math></inline-formula> and field-effect mobility of 5.4 cm<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{{2}}\cdot \text {V}^{-{1}}\cdot \text {s}^{-{1}}$ </tex-math></inline-formula>. Under the 255 nm illumination, the phototransistor presented a gate voltage-controlled ultraviolet response. With zero voltage gate bias, a responsivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$3.2\times 10^{{5}}$ </tex-math></inline-formula> AW<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{-{1}}$ </tex-math></inline-formula> and a detectivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.4\times 10^{{16}}$ </tex-math></inline-formula> Jones was obtained. As a phototransistor made from amorphous semiconductors, the response speed is very low. The rise time and decay time are estimated at about 12 s and over 1800 s, respectively. However, the response time was tremendously improved to be less than <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$25~\mu $ </tex-math></inline-formula>s by interleaving both positive and negative gate voltage pulses synchronized with the UV illumination. The synchronous gate voltage pulses can be easily realized in readout integrated circuits (ROICs). Therefore, a-IGZO thin-film phototransistor should be a good candidate for flexible solar-blind ultraviolet photodetector with excellent performance.

IEEE Transactions on Electron DevicesVol. 71(11)
University of Electronic Science and Technology of China (CN), National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
National Natural Science Foundation of China
Affordable and clean energy
Openalex Percentile: Top 35%
Ga2O3 and related materials
0.71
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