Determining Neutron-based static cross-section of a SRAM-based FPGA in a simplified setup

This work presents a simplified setup composed of americium and beryllium sources that was capable of generating a neutron flux to measure a static cross-section of a SRAM-based FPGA in the Chemical Department of UFRGS. The sources are stored in a special container with an opening on top, where the board containing the SRAM-based FPGAs is placed. Data monitoring and collection occurred every three days, using a computer connected to the board. The experiment found single and multiple bit-flips, including some multiple bit-flips events whose behavior was not fully explained, requiring a more in-depth analysis. However, the results obtained were sufficient to demonstrate that a simple setup is capable of showing single, double, triple, and even quadruple events and results are comparable with related works published in the literature.