Origin Analysis and Mitigation Method of Voltage Oscillation Occurred Inside the Winding of Medium-Voltage Medium-Frequency Transformer

The medium-voltage medium-frequency transformer is a critical component of high-power dc converters. However, the ultrafast switching speed of wide bandgap semiconductors can induce voltage oscillations in the medium-frequency transformer, increasing the risk of primary-insulation partial discharge and leading to permanent breakdown. Existing research has focused on voltage oscillations occurring at ports, but there is insufficient knowledge about those happening within the winding. This article presents a model for calculating internal voltage oscillations. Compared to conventional models, it is simple and considers the core electrical energy for the first time. Accordingly, the physically-based analytical formulas are derived to calculate voltage oscillations. Based on the model, the relationship between voltage oscillations, port voltage, and transformer structure is analyzed. The oscillation mitigation method is presented and validated by experiment.

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Publication Details

Journal
IEEE Transactions on Power Electronics
Published
2024-09-19
DOI
https://doi.org/10.1109/tpel.2024.3462413
Citations
5
Primary Topic
Power Systems and Technologies
Type
article
Field-Weighted Citation Impact
1.04
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article

Origin Analysis and Mitigation Method of Voltage Oscillation Occurred Inside the Winding of Medium-Voltage Medium-Frequency Transformer

Haozhe Jin, Zewei Hao, Yueyin Wang, Wu Chen et al.
5 citations
IEEE Transactions on Power Electronics
Power Systems and Technologies
1.04
article

Origin Analysis and Mitigation Method of Voltage Oscillation Occurred Inside the Winding of Medium-Voltage Medium-Frequency Transformer

Haozhe Jin, Zewei Hao, Yueyin Wang, Wu Chen, Siyi Luo, Xin Li, Xiao Yu, Zhan Shen, Xuhao Zhu
article en
5 citations

Abstract

The medium-voltage medium-frequency transformer is a critical component of high-power dc converters. However, the ultrafast switching speed of wide bandgap semiconductors can induce voltage oscillations in the medium-frequency transformer, increasing the risk of primary-insulation partial discharge and leading to permanent breakdown. Existing research has focused on voltage oscillations occurring at ports, but there is insufficient knowledge about those happening within the winding. This article presents a model for calculating internal voltage oscillations. Compared to conventional models, it is simple and considers the core electrical energy for the first time. Accordingly, the physically-based analytical formulas are derived to calculate voltage oscillations. Based on the model, the relationship between voltage oscillations, port voltage, and transformer structure is analyzed. The oscillation mitigation method is presented and validated by experiment.

IEEE Transactions on Power ElectronicsVol. 40(1)
China Academy of Engineering Physics (CN), Southeast University (CN)
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Openalex Percentile: Top 23%
Power Systems and Technologies
1.04
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