Genetic variability, correlation and path analysis studies for yield and yield contributing traits in sorghum (Sorghum bicolor (L.) Moench)

A study was undertaken to analyze the genetic variability, correlation and path coefficient analysis of yield and yield contributing traits in sorghum. “M3 generation of Kharif sorghum [Sorghum bicolor (L.) Moench]” Stuied for genetic variability through induced mutation. Different doses of gamma rays and EMS concentration were used to irradiate seeds of PVK 801 genotype. Genetic variability was significant for yield and yield contributing characters among the M3 generation. Results indicated relatively higher mean performance in treatment 20 kR + 0.2% EMS dose for most of the characters. The investigation was carried out at experimental Research Farm of Department of Agricultural Botany, VNMKV, Parbhani during Kharif, 2020. Wide variation for most of the characters in segregating M3 generation explained by GCV and PCV estimates. Path analysis revealed that the number of grains per primary exerted the highest positive direct effect on seed yield followed by number of primaries per panicle, panicle width, panicle length, days, plant heightt and 100 seed weight. Hence these traits can be considered as selection indices for sorghum improvement programme. The component of residual effect of path analysis was 0.6. For grain yield per plant high GCV, PCV, heritability and GAM were reported. The positive significant correlation was noticed for grain yield per plant with number of grains per primary, primaries per panicle, panicle length, panicle width, 100 seed weight, and days to 50 percent flowering.