Application of x-ray energy dispersive spectroscopy to analyzing the thickness of diamond-like carbon film deposited on the surface of microparticles

Depositing diamond-like carbon (DLC) film is considered to be more promising for surface modification of microparticles. The development of reliable and precise measurement techniques for DLC coatings on microparticles is crucial for advancing research in this field. This paper introduces a methodological approach for quantifying the thickness of the film on microparticles. The thickness of the film is obtained by establishing the quantitative relationship between the energy lost when electrons pass through the film and the thickness of the film. The proposed method allows for the estimation of film thickness by assessing solely the elemental abundance on the particle surfaces.

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Publication Details

Journal
Review of Scientific Instruments
Published
2024-09-01
DOI
https://doi.org/10.1063/5.0180465
Citations
3
Primary Topic
Diamond and Carbon-based Materials Research
Type
article
Field-Weighted Citation Impact
0.35

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article

Application of x-ray energy dispersive spectroscopy to analyzing the thickness of diamond-like carbon film deposited on the surface of microparticles

Qiaogen Zhang, Zhicheng Wu, Junping Zhao, Z. An et al.
3 citations
Review of Scientific Instruments
Diamond and Carbon-based Materials Research
0.35
article

Application of x-ray energy dispersive spectroscopy to analyzing the thickness of diamond-like carbon film deposited on the surface of microparticles

Qiaogen Zhang, Zhicheng Wu, Junping Zhao, Z. An, Zhijun Ai
article en
3 citations

Abstract

Depositing diamond-like carbon (DLC) film is considered to be more promising for surface modification of microparticles. The development of reliable and precise measurement techniques for DLC coatings on microparticles is crucial for advancing research in this field. This paper introduces a methodological approach for quantifying the thickness of the film on microparticles. The thickness of the film is obtained by establishing the quantitative relationship between the energy lost when electrons pass through the film and the thickness of the film. The proposed method allows for the estimation of film thickness by assessing solely the elemental abundance on the particle surfaces.

Review of Scientific InstrumentsVol. 95(9)
State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University (CN)
Science and Technology Project of State Grid
Affordable and clean energy
Openalex Percentile: Top 44%
Diamond and Carbon-based Materials Research
0.35
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