Design and TCAD Study of p-GaN Gate HEMT With a Nanowire Structure for Stable V<sub>TH</sub> and Self-Clamped Gate Leakage
In this article, a novel p-GaN HEMT is proposed based on an Ohmic p-GaN nanowire gate structure. The p-GaN nanowire structure behaves as a normally on p-FET with MIS-gate characteristics, enabling the device to feature self-clamped <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {G}}$ </tex-math></inline-formula>, large <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${g}_{\text {m}}$ </tex-math></inline-formula>, and a stable <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {TH}}$ </tex-math></inline-formula>. The proto-type device is successfully fabricated, featuring a stable <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {TH}}$ </tex-math></inline-formula>. With the help of TCAD simulation, an in-depth analysis of the operation principle, including <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {G}}$ </tex-math></inline-formula> self-clamp effect, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {TH}}$ </tex-math></inline-formula> recovery process, and sidewall protection is conducted. Scaling down of the p-GaN nanowire structure is analyzed and proved to be an effective way to optimize its performance, where the trade-off relation between the clamping effect of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {G}}$ </tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {TH}}$ </tex-math></inline-formula> recovery speed is revealed.
Authors
- Zhongchen Ji (ORCID: https://orcid.org/0009-0007-2725-1415)
- Sen Huang (ORCID: https://orcid.org/0000-0002-5980-3161)
- Qimeng Jiang (ORCID: https://orcid.org/0000-0002-7554-1763)
- Xinyue Dai (ORCID: https://orcid.org/0000-0001-9761-7119)
- Xinhua Wang (ORCID: https://orcid.org/0000-0002-6592-7515)
- Xinyu Liu (ORCID: https://orcid.org/0000-0003-0854-8559)
Institutions
- Institute of Microelectronics (CN)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2024-09-17
- DOI
- https://doi.org/10.1109/ted.2024.3454027
- Citations
- 1
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.31
Funders
- National Natural Science Foundation of China
- National Key Research and Development Program of China