Design of sCMOS-based EUV imaging system

Experimental Advanced Superconducting Tokamak (EAST) employs Extreme Ultraviolet (EUV) spectroscopic diagnostic systems to measure the impurity radiation of the core plasma. However, the sensor chip is significantly affected by the interference from hard X-rays on, resulting in a significant amount of single-pixel noise in the collected spectral image data. This interference presents significant challenges for accurately analyzing the impurity radiation in fusion plasma. To address this issue, hardware algorithms are prepared to be integrated into the detector to optimize the imaging quality. However, since the existing commercial detector could not be modified in terms of hardware and programming, decision to develop an imaging system for EUV spectral diagnosis. This imaging system will be used on EAST for EUV spectral diagnosis and for future research on hardware optimization algorithms. The imaging system is designed with the GSENSE400BSI sensor chip as the photosensitive component and the AC7Z100B board as the control center, and it also includes two high-speed transmission interfaces: USB 3.0 and Camera Link. Finally, to verify the acquisition function and imaging quality of the imaging system, tests were conducted on the established spectral image acquisition platform. The results showed that the imaging system could normally complete the spectral image acquisition with high- quality imaging.

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Publication Details

Published
2024-09-13
DOI
https://doi.org/10.1117/12.3040452
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
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Design of sCMOS-based EUV imaging system

Zichao Lin, Bo Lyu, Hongming Zhang, Baofa Sun et al.
CCD and CMOS Imaging Sensors
article

Design of sCMOS-based EUV imaging system

Zichao Lin, Bo Lyu, Hongming Zhang, Baofa Sun, Huajian Ji
article en

Abstract

Experimental Advanced Superconducting Tokamak (EAST) employs Extreme Ultraviolet (EUV) spectroscopic diagnostic systems to measure the impurity radiation of the core plasma. However, the sensor chip is significantly affected by the interference from hard X-rays on, resulting in a significant amount of single-pixel noise in the collected spectral image data. This interference presents significant challenges for accurately analyzing the impurity radiation in fusion plasma. To address this issue, hardware algorithms are prepared to be integrated into the detector to optimize the imaging quality. However, since the existing commercial detector could not be modified in terms of hardware and programming, decision to develop an imaging system for EUV spectral diagnosis. This imaging system will be used on EAST for EUV spectral diagnosis and for future research on hardware optimization algorithms. The imaging system is designed with the GSENSE400BSI sensor chip as the photosensitive component and the AC7Z100B board as the control center, and it also includes two high-speed transmission interfaces: USB 3.0 and Camera Link. Finally, to verify the acquisition function and imaging quality of the imaging system, tests were conducted on the established spectral image acquisition platform. The results showed that the imaging system could normally complete the spectral image acquisition with high- quality imaging.

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CCD and CMOS Imaging Sensors
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Design of sCMOS-based EUV imaging system — Zichao Lin, Bo Lyu, et al. · (2024) | TGRS Research Map | TGRS