Detection Method for Inter-Turn Short Circuit Faults in Dry-Type Transformers Based on an Improved YOLOv8 Infrared Image Slicing-Aided Hyper-Inference Algorithm

Inter-Turn Short Circuit (ITSC) faults do not necessarily produce high temperatures but exhibit distinct heat distribution and characteristics. This paper proposes a novel fault diagnosis and identification scheme utilizing an improved You Look Only Once Vision 8 (YOLOv8) algorithm, enhanced with an infrared image slicing-aided hyper-inference (SAHI) technique, to automatically detect ITSC fault trajectories in dry-type transformers. The infrared image acquisition system gathers data on ITSC fault trajectories and captures images with varying contrast to enhance the robustness of the recognition model. Given that the fault trajectory constitutes a small portion of the overall infrared image and is subject to significant background interference, traditional recognition algorithms often misjudge or omit faults. To address this, a YOLOv8-based visual detection method incorporating Dynamic Snake Convolution (DSConv) and the Slicing-Aided Hyper-Inference algorithm is proposed. This method aims to improve recognition precision and accuracy for small targets in complex backgrounds, facilitating accurate detection of ITSC faults in dry-type transformers. Comparative tests with the YOLOv8 model, Fast Region-based Convolutional Neural Networks (Fast-RCNNs), and Residual Neural Networks (Retina-Nets) demonstrate that the enhancements significantly improve model convergence speed and fault trajectory detection accuracy. The approach offers valuable insights for advancing infrared image diagnostic technology in electrical power equipment.

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Publication Details

Journal
Energies
Published
2024-09-12
DOI
https://doi.org/10.3390/en17184559
Citations
7
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
1.46
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article

Detection Method for Inter-Turn Short Circuit Faults in Dry-Type Transformers Based on an Improved YOLOv8 Infrared Image Slicing-Aided Hyper-Inference Algorithm

Jianhua Xia, Hekai Yang, Pengcheng Zhao, Yu-Chuan Wen et al.
7 citations
Energies
Integrated Circuits and Semiconductor Failure Analysis
1.46
article

Detection Method for Inter-Turn Short Circuit Faults in Dry-Type Transformers Based on an Improved YOLOv8 Infrared Image Slicing-Aided Hyper-Inference Algorithm

Jianhua Xia, Hekai Yang, Pengcheng Zhao, Yu-Chuan Wen, Jingang Wang, Haobo Yang, Zhaochuang Zhang, Zuofu Ma, Jinyao Dou, Liting Weng
article en
7 citations

Abstract

Inter-Turn Short Circuit (ITSC) faults do not necessarily produce high temperatures but exhibit distinct heat distribution and characteristics. This paper proposes a novel fault diagnosis and identification scheme utilizing an improved You Look Only Once Vision 8 (YOLOv8) algorithm, enhanced with an infrared image slicing-aided hyper-inference (SAHI) technique, to automatically detect ITSC fault trajectories in dry-type transformers. The infrared image acquisition system gathers data on ITSC fault trajectories and captures images with varying contrast to enhance the robustness of the recognition model. Given that the fault trajectory constitutes a small portion of the overall infrared image and is subject to significant background interference, traditional recognition algorithms often misjudge or omit faults. To address this, a YOLOv8-based visual detection method incorporating Dynamic Snake Convolution (DSConv) and the Slicing-Aided Hyper-Inference algorithm is proposed. This method aims to improve recognition precision and accuracy for small targets in complex backgrounds, facilitating accurate detection of ITSC faults in dry-type transformers. Comparative tests with the YOLOv8 model, Fast Region-based Convolutional Neural Networks (Fast-RCNNs), and Residual Neural Networks (Retina-Nets) demonstrate that the enhancements significantly improve model convergence speed and fault trajectory detection accuracy. The approach offers valuable insights for advancing infrared image diagnostic technology in electrical power equipment.

EnergiesVol. 17(18)
Chongqing University (CN)
Openalex Percentile: Top 18%
Integrated Circuits and Semiconductor Failure Analysis
1.46
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