Study of the Multifrequency Susceptibility of Operational Amplifiers
This paper deals with the susceptibility of operational amplifiers (op-amps) in multifrequency injection. After an in-depth analysis of the different failure mechanisms that induces DC-offset based on experimental results on a general-purpose op-amp, the paper proposes a risk assessment method based on continuous wave susceptibility test results.
Authors
- Alexandre Boyer (ORCID: https://orcid.org/0000-0003-4955-5915)
- Fabrice Caignet (ORCID: https://orcid.org/0000-0003-2166-9347)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Toulouse III - Paul Sabatier (FR)
- Laboratoire d'Analyse et d'Architecture des Systèmes (FR)
- Institut National des Sciences Appliquées de Toulouse (FR)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/emceurope59828.2024.10722498
- Primary Topic
- Semiconductor Quantum Structures and Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00