Using Near-Field Scan to Predict the Conducted Immunity of Electronic Components up to 6 GHz

In the context of the growing threat of radio frequency directed energy weapons (RF DEW), near-field scan immunity (NFSI) stands as a powerful method for analysing the electromagnetic (EM) susceptibility of components, allowing the study of the response of an electronic device subject to an intentional electromagnetic interference (IEMI). This non-intrusive technique precisely targets component pins that are otherwise inaccessible with commonly used immunity investigation methods. In this paper, the quantitative measurement of the near-field coupling on a microstrip line is discussed and compared to a conducted injection based on the direct power injection (DPI) standard. Two E-field and $\mathbf{H}$-field injection probes are calibrated and an experimental validation is conducted with both linear and non-linear loads. The results underscore the importance of NFSI in investigating systems vulnerability to RF DEW.