A PVT-Insensitive Sub-Ranging Current Reference Achieving 11.4-ppm/ ° C From -20 °C to 125 °C
This article presents a sub-ranging current reference with a low-temperature coefficient (TC) across a wide temperature range. By using a TC-adjustable current source and a process-insensitive sub-range detector, the impact of second-order TC can be reduced by nearly fourfold, without any discontinuities at the subrange boundaries. Implemented in a 0.18-<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>m CMOS process, the proposed current reference achieves an average TC of 11.4-ppm/°C across from -20 °C to 125 °C, obtained from 45 samples across five process corners without chip-by-chip calibration. The proposed current source exhibits low line and load sensitivities of 365 and 181 ppm/V, respectively, and an integrated noise of 38.9 pArms within a 10-Hz bandwidth.
Authors
- Pangi Park (ORCID: https://orcid.org/0000-0003-0443-1599)
- SeongHwan Cho (ORCID: https://orcid.org/0000-0001-7938-2694)
- Junghyup Lee (ORCID: https://orcid.org/0000-0001-7941-8183)
Institutions
- Korea Advanced Institute of Science and Technology (KR)
- Daegu Gyeongbuk Institute of Science and Technology (KR)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2024-09-06
- DOI
- https://doi.org/10.1109/jssc.2024.3450950
- Citations
- 6
- Primary Topic
- Advanced Electrical Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.25