Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator
In this paper, a random noise study is carried out, generated by an optical random number generator based on an InGaAs p-i-n photodiode. The influence of the procedure of equalization of the energy values of the of the continuous wavelet transform on the efficiency of passing the test for the FFT randomness from the set of NIST statistical tests.
Authors
- L. R. Gilyazov (ORCID: https://orcid.org/0000-0002-5349-1400)
- M. E. Sibgatullin
- N. M. Arslanov (ORCID: https://orcid.org/0000-0001-6651-693X)
- D. A. Mavkov
Institutions
- Kazan State Technical University named after A. N. Tupolev (RU)
Publication Details
- Published
- 2024-09-06
- DOI
- https://doi.org/10.1117/12.3026581
- Primary Topic
- Image Processing Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00