Development and Applications of a Microcontroller-Based Logic Tester for Integrated Circuits in the

Background: In the electronics lab, testing equipment, especially those concentrating on integrated circuits (ICs), is critical. The ubiquitous usage of one or more integrated circuits (ICs) in electronic systems needs thorough testing of their functioning. Objective: This research aims to develop a Microcontroller-based Logic Tester specially tailored for most Integrated Circuits in the 74xx Series Logic Gates and uses the ATmega328. The primary purpose is to reproduce the attributes of a logic gate IC using the truth table, enabling the state of the IC's gates to be determined. Methods: Several design techniques were investigated. Following careful consideration, a single approach for implementation was selected. Modules were developed independently. After extensive testing and successful simulations, these components were combined to complete the project. Results: The designed IC tester is cost-effective and user-friendly; it examines ICs quickly and presents findings to assess their functioning. The tester compares the output of each gate to a truth table. The results for both working and faulty ICs are shown on an LCD. Conclusion: In today's fast-changing electronics scene, an efficient digital IC tester that is both economical and dependable is critical. The project's conclusion provides a digital IC tester that simplifies the IC verification process for students and functions as a reliable tool in industrial settings.

Authors

Publication Details

Journal
Radioelectronics Nanosystems Information Technologies
Published
2024-09-06
DOI
https://doi.org/10.17725/j.rensit.2024.16.573
Primary Topic
Sensor Technology and Measurement Systems
Type
article
Field-Weighted Citation Impact
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article

Development and Applications of a Microcontroller-Based Logic Tester for Integrated Circuits in the

Hayder Mahmood Salman, Saad Jabbar Abbas, Роман Калматов, Salam Khalaf Abdullah et al.
Radioelectronics Nanosystems Information Technologies
Sensor Technology and Measurement Systems
article

Development and Applications of a Microcontroller-Based Logic Tester for Integrated Circuits in the

Hayder Mahmood Salman, Saad Jabbar Abbas, Роман Калматов, Salam Khalaf Abdullah, Pshtiwan Shakor, Mohammed Abdulkreem Mohammed, Ali Ali Saber Mohammed, Marwan Aziz Mohammed
article en

Abstract

Background: In the electronics lab, testing equipment, especially those concentrating on integrated circuits (ICs), is critical. The ubiquitous usage of one or more integrated circuits (ICs) in electronic systems needs thorough testing of their functioning. Objective: This research aims to develop a Microcontroller-based Logic Tester specially tailored for most Integrated Circuits in the 74xx Series Logic Gates and uses the ATmega328. The primary purpose is to reproduce the attributes of a logic gate IC using the truth table, enabling the state of the IC's gates to be determined. Methods: Several design techniques were investigated. Following careful consideration, a single approach for implementation was selected. Modules were developed independently. After extensive testing and successful simulations, these components were combined to complete the project. Results: The designed IC tester is cost-effective and user-friendly; it examines ICs quickly and presents findings to assess their functioning. The tester compares the output of each gate to a truth table. The results for both working and faulty ICs are shown on an LCD. Conclusion: In today's fast-changing electronics scene, an efficient digital IC tester that is both economical and dependable is critical. The project's conclusion provides a digital IC tester that simplifies the IC verification process for students and functions as a reliable tool in industrial settings.

Radioelectronics Nanosystems Information TechnologiesVol. 16(5)
Openalex Percentile: Top 84%
Sensor Technology and Measurement Systems
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