PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection

To address the challenges of high model complexity and low accuracy in detecting small targets in insulator defect detection using UAV aerial imagery, we propose a lightweight algorithm, PAL-YOLOv8. Firstly, the baseline model, YOLOv8n, is enhanced by incorporating the PKI Block from PKINet to improve the C2f module, effectively reducing the model complexity and enhancing feature extraction capabilities. Secondly, Adown from YOLOv9 is employed in the backbone and neck for downsampling, which retains more feature information while reducing the feature map size, thus improving the detection accuracy. Additionally, Focaler-SIoU is used as the bounding-box regression loss function to improve model performance by focusing on different regression samples. Finally, pruning is applied to the improved model to further reduce its size. The experimental results show that PAL-YOLOv8 achieves an mAP50 of 95.0%, which represents increases of 5.5% and 2.6% over YOLOv8n and YOLOv9t, respectively. Furthermore, GFLOPs is only 3.9, the model size is just 2.7 MB, and the parameter count is only 1.24 × 106.

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Publication Details

Journal
Electronics
Published
2024-09-03
DOI
https://doi.org/10.3390/electronics13173500
Citations
3
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
1.05

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article

PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection

Kerang Cao, Hoe-Kyung Jung, Du Zhang, Changsu Kim et al.
3 citations
Electronics
Industrial Vision Systems and Defect Detection
1.05
article

PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection

Kerang Cao, Hoe-Kyung Jung, Du Zhang, Changsu Kim, K. L. Han
article en
3 citations

Abstract

To address the challenges of high model complexity and low accuracy in detecting small targets in insulator defect detection using UAV aerial imagery, we propose a lightweight algorithm, PAL-YOLOv8. Firstly, the baseline model, YOLOv8n, is enhanced by incorporating the PKI Block from PKINet to improve the C2f module, effectively reducing the model complexity and enhancing feature extraction capabilities. Secondly, Adown from YOLOv9 is employed in the backbone and neck for downsampling, which retains more feature information while reducing the feature map size, thus improving the detection accuracy. Additionally, Focaler-SIoU is used as the bounding-box regression loss function to improve model performance by focusing on different regression samples. Finally, pruning is applied to the improved model to further reduce its size. The experimental results show that PAL-YOLOv8 achieves an mAP50 of 95.0%, which represents increases of 5.5% and 2.6% over YOLOv8n and YOLOv9t, respectively. Furthermore, GFLOPs is only 3.9, the model size is just 2.7 MB, and the parameter count is only 1.24 × 106.

ElectronicsVol. 13(17)
Pai Chai University (KR), Shenyang University of Chemical Technology (CN), Woosong University (KR)
Ministry of Education
Affordable and clean energy
Openalex Percentile: Top 20%
Industrial Vision Systems and Defect Detection
1.05
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PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection — Kerang Cao, Hoe-Kyung Jung, et al. · Electronics (2024) | TGRS Research Map | TGRS