Inverse-Designed 3D Laser Nanoprinted Phase Masks to Extend the Depth of Field of Imaging Systems

In optical imaging, achieving high resolution often comes at the expense of a shallow depth of field. This means that when using a standard microscope, any minor movement of the object along the optical axis can cause the image to become blurry. To address this issue, we exploit inverse design techniques to optimize a phase mask which, when inserted into a standard microscope, extends the depth of field by a factor of approximately four without compromising the microscope’s resolution. Differentiable Fourier optics simulations allow us to rapidly iterate toward an optimized design in a hybrid fashion, starting with gradient-free Bayesian optimization and proceeding to a local gradient-based optimization. To fabricate the device, a commercial two-photon 3D laser nanoprinter is used, in combination with a two-step precompensation routine, providing high fabrication speed and much better than subwavelength accuracy. We find excellent agreement between our numerical predictions and the measurements upon integrating the phase mask into a microscope and optically characterizing selected samples. The phase mask enables us to conduct simultaneous multiplane imaging of objects separated by distances that cannot be achieved with the original microscope.

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Publication Details

Journal
ACS Photonics
Published
2024-09-03
DOI
https://doi.org/10.1021/acsphotonics.4c00953
Citations
3
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
0.75

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article

Inverse-Designed 3D Laser Nanoprinted Phase Masks to Extend the Depth of Field of Imaging Systems

Andriy Shevchenko, Sebastian Kalt, Panu Hildén, Thomas Jebb Sturges et al.
3 citations
ACS Photonics
Optical measurement and interference techniques
0.75
article

Inverse-Designed 3D Laser Nanoprinted Phase Masks to Extend the Depth of Field of Imaging Systems

Andriy Shevchenko, Sebastian Kalt, Panu Hildén, Thomas Jebb Sturges, M. Nyman, Carsten Rockstuhl, Martin Wegener, Kauri Pälsi
article en
3 citations

Abstract

In optical imaging, achieving high resolution often comes at the expense of a shallow depth of field. This means that when using a standard microscope, any minor movement of the object along the optical axis can cause the image to become blurry. To address this issue, we exploit inverse design techniques to optimize a phase mask which, when inserted into a standard microscope, extends the depth of field by a factor of approximately four without compromising the microscope’s resolution. Differentiable Fourier optics simulations allow us to rapidly iterate toward an optimized design in a hybrid fashion, starting with gradient-free Bayesian optimization and proceeding to a local gradient-based optimization. To fabricate the device, a commercial two-photon 3D laser nanoprinter is used, in combination with a two-step precompensation routine, providing high fabrication speed and much better than subwavelength accuracy. We find excellent agreement between our numerical predictions and the measurements upon integrating the phase mask into a microscope and optically characterizing selected samples. The phase mask enables us to conduct simultaneous multiplane imaging of objects separated by distances that cannot be achieved with the original microscope.

ACS PhotonicsVol. 11(9)
Karlsruhe Institute of Technology (DE), Karlsruhe University of Education (DE), Aalto University (FI)
Alexander von Humboldt-Stiftung, Carl-Zeiss-Stiftung, Karlsruhe Institute of Technology, Helmholtz-Gemeinschaft, Deutsche Forschungsgemeinschaft, Tekniikan Edistämissäätiö, Luonnontieteiden ja Tekniikan Tutkimuksen Toimikunta
Openalex Percentile: Top 28%
Optical measurement and interference techniques
0.75
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