Single-shot picosecond interferometry for the characterization of laser-driven shock waves

In conventional laser-driven shock experiments, an out-of-plane shock wave is launched and is typically detected interferometrically after it propagates through the sample. In such experiments, the target materials are unavoidably optically damaged at each laser shot. This necessitates changing targets after laser exposure, lowering the shot-to-shot reproducibility and data quality. Here we present a Sagnac interferometer combined with an echelon that can split a single femtosecond probe into many beams, very well adapted for single-shot interferometric characterization of laser-induced shock waves. The echelon provides a 10 ps time resolution and a full time window of about 150 ps. The simplicity, stability, and sensitivity of the single-shot Sagnac interferometer technique ease the thorough characterization of picosecond to nanosecond shock waves, specifically for samples available in limited quantities or for samples that are not uniform from one region to the next.