Enhanced Scratch Detection for Textured Materials Based on Optimized Photometric Stereo Vision and Fast Fourier Transform–Gabor Filtering

In the process of scratch defect detection in textured materials, there are often problems of low efficiency in traditional manual detection, large errors in machine vision, and difficulty in distinguishing defective scratches from the background texture. In order to solve these problems, we developed an enhanced scratch defect detection system for textured materials based on optimized photometric stereo vision and FFT-Gabor filtering. We designed and optimized a novel hemispherical image acquisition device that allows for selective lighting angles. This device integrates images captured under multiple light sources to obtain richer surface gradient information for textured materials, overcoming issues caused by high reflections or dark shadows under a single light source angle. At the same time, for the textured material, scratches and a textured background are difficult to distinguish; therefore, we introduced a Gabor filter-based convolution kernel, leveraging the fast Fourier transform (FFT), to perform convolution operations and spatial domain phase subtraction. This process effectively enhances the defect information while suppressing the textured background. The effectiveness and superiority of the proposed method were validated through material applicability experiments and comparative method evaluations using a variety of textured material samples. The results demonstrated a stable scratch capture success rate of 100% and a recognition detection success rate of 98.43% ± 1.0%.