Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Abstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices.

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Publication Details

Journal
Advanced Materials Interfaces
Published
2024-09-02
DOI
https://doi.org/10.1002/admi.202400534
Citations
2
Primary Topic
Laser-Matter Interactions and Applications
Type
article
Field-Weighted Citation Impact
0.68

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article

Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Martin Wünsche, Muhammad Hussain, Julius Reinhard, Giancarlo Soavi et al.
2 citations
Advanced Materials Interfaces
Laser-Matter Interactions and Applications
0.68
article

Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Martin Wünsche, Muhammad Hussain, Julius Reinhard, Giancarlo Soavi, Ana M. Valencia, Caterina Cocchi, Alisson R. Cadore, Felix Wiesner, Marco Gruenewald, G. G. Paulus, Johann J. Abel, Silvio Fuchs, Juan Pablo Guerrero Felipe, Vipin Krishna
article en
2 citations

Abstract

Abstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices.

Advanced Materials InterfacesVol. 12(3)
Hochschule Mittweida (DE), Helmholtz Institute Jena (DE), Carl von Ossietzky Universität Oldenburg (DE), GSI Helmholtz Centre for Heavy Ion Research (DE), Humboldt-Universität zu Berlin (DE), Electro Optical Systems (Germany) (DE), Brazilian Center for Research in Energy and Materials (BR), Freie Universität Berlin (DE), Friedrich Schiller University Jena (DE)
Carl von Ossietzky Universität Oldenburg, Deutsche Forschungsgemeinschaft, Bundesministerium für Bildung und Forschung, Fraunhofer-Gesellschaft, Conselho Nacional de Desenvolvimento Científico e Tecnológico, Max-Planck-Gesellschaft, Thüringer Aufbaubank, Niedersächsisches Ministerium für Wissenschaft und Kultur, European Social Fund
Affordable and clean energy
Openalex Percentile: Top 31%
Laser-Matter Interactions and Applications
0.68
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