Exploring Resilience of LPDRAM Against RowHammer
Editor’s notes: This article investigates, for the first time, how RowHammer attacks impact LPDRAM memories. The findings reveal that RowHammer causes bit flips at specific memory locations, which facilitates more predictable attacks.—Kanad Basu, University of Texas at Dallas, USA
Authors
- Pravin Srivastav (ORCID: https://orcid.org/0000-0001-9004-8726)
- Anandpreet Kaur (ORCID: https://orcid.org/0000-0002-1210-1939)
- Bibhas Ghoshal (ORCID: https://orcid.org/0000-0002-8228-6481)
Institutions
- Indian Institute of Information Technology Allahabad (IN)
Publication Details
- Journal
- IEEE Design and Test
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/mdat.2024.3453197
- Primary Topic
- Advanced Malware Detection Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Ministry of Education, India