Insulator Defect Detection Based on YOLOv5s-KE

To tackle the issue of low detection accuracy in insulator images caused by intricate backgrounds and small defect sizes, as well as the requirement for real-time detection on embedded and mobile devices, this research introduces the YOLOv5s-KE model. Integrating multiple strategies, YOLOv5s-KE aims to boost detection accuracy significantly. Initially, an enhanced anchor generation method utilizing the K-means++ algorithm is proposed to generate more appropriate anchor boxes for insulator defects. Moreover, an attention mechanism is integrated into both the backbone and neck networks to enhance the model’s capacity to focus on defect features and resist interference. To improve the detection of small defects, the EIoU loss function is implemented in place of the original CIoU loss function. In order to meet the real-time detection needs on embedded and mobile devices, the model is further refined through the integration of Ghost convolution for lightweight feature extraction and a linear transformation to reduce the computational burden of standard convolution. A channel pruning strategy is deployed to optimize the sparsely trained network, diminishing redundancy, and improving model generalization. Additionally, the CARAFE operator replaces the original upsampling operator to minimize model parameters and elevate detection speed. Experimental outcomes demonstrate that YOLOv5s-KE achieves a detection accuracy of 92.3% on the Chinese transmission line insulator dataset, marking a 5.2% enhancement over the original YOLOv5s. The streamlined version of YOLOv5s-KE achieves a detection speed of 94.3 frames per second, indicating an improvement of 30.1 frames per second compared to the original model. Model parameters are condensed to 9.6 M, resulting in a detection accuracy of 91.1%. This study underscores the precision and efficiency of the proposed approach, suggesting that the advanced strategies explored introduce novel possibilities for insulator defect detection.