Oxygen-Atom Incorporated Ferroelectric AlScN Capacitors for Multi-Level Operation
The effect of oxygen-atom incorporation in 50-nm-thick ferroelectric Al0.89Sc0.11N films was investigated. The fabricated films exhibited a high remanent polarization (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${P}_{\text {r}})$ </tex-math></inline-formula> exceeding <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$100~\mu $ </tex-math></inline-formula>C/cm2, irrespective of the oxygen content studied. An increase in oxygen content led to a decrease in coercive field (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {c}})$ </tex-math></inline-formula> from 5.2 to 4.4 MV/cm and an increase in the static dielectric constant (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\varepsilon _{\text {i}})$ </tex-math></inline-formula> from 15 to 19. This was likely due to the formation of substitute O and Al vacancy complex defects to ease N-atom displacement. Additionally, higher oxygen content resulted in imprint effect elimination, leakage current reduction, and breakdown field (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {BD}})$ </tex-math></inline-formula> enhancement, which are beneficial for ferroelectric memory applications. The gentle and linear relationship between <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${P}_{\text {r}}$ </tex-math></inline-formula> and the electric field (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E})$ </tex-math></inline-formula> enabled precise control of partial polarization switching, supporting multi-level operation. Although issues related to fatigue and endurance cycles remain to be addressed, the high <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${P}_{\text {r}}$ </tex-math></inline-formula> and potential for multi-level operation are suitable for crossbar-based analog in-memory computing.
Authors
- Takuya Hoshii (ORCID: https://orcid.org/0000-0002-2873-8715)
- Kuniyuki Kakushima (ORCID: https://orcid.org/0000-0002-8527-1402)
- Edward Yi Chang (ORCID: https://orcid.org/0000-0003-1616-5240)
- Hirofumi Nishida
- Hitoshi Wakabayashi (ORCID: https://orcid.org/0000-0001-5509-521X)
- Si-Meng Chen (ORCID: https://orcid.org/0000-0001-7714-6129)
- Kazuo Tsutsui (ORCID: https://orcid.org/0000-0002-5472-5539)
- Sung-Lin Tsai
Institutions
- Tokyo Institute of Technology (JP)
- National Yang Ming Chiao Tung University (TW)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/led.2024.3453111
- Citations
- 9
- Primary Topic
- Acoustic Wave Resonator Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.66