MKD-SFasterNet: A Lightweight Edge Computing Architecture for Mechanical Fault Diagnosis

In the era of intelligent manufacturing, faced with the explosive growth of equipment and sensor data, deep learning (DL)-based fault diagnosis methods with significant feature extraction capabilities have been widely applied. However, as DL networks become increasingly complex, their computational and storage requirements increase, which poses a challenge for resource-constrained industrial scenarios. To address the problem, this study proposes a novel lightweight edge computing architecture, namely, multilevel knowledge distillation improved slim FasterNet (MKD-SFasterNet). First, the lightweight network FasterNet is optimized by using channel shuffle and group convolution to minimize the parameters and computational complexity of the model while improving the diagnostic accuracy. Second, the MKD method incorporates label decoupling and feature semantic information. It uses the gradient conflict elimination strategy to optimize the loss function, which further improves the diagnostic accuracy of the model without adding additional resources. Finally, the experiment was conducted using two mechanical fault datasets. The proposed method achieves the highest diagnostic accuracies of 94.95% and 94.25% compared to other lightweight networks, while the network’s number of parameters, floating-point calculations, and storage requirements are reduced by 98, 28, and 22 times compared to ResNet, respectively. Moreover, inference on edge devices takes only 4 ms, which proves its efficiency and superiority.

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Publication Details

Journal
IEEE Sensors Journal
Published
2024-09-02
DOI
https://doi.org/10.1109/jsen.2024.3449139
Citations
6
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
2.09
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article

MKD-SFasterNet: A Lightweight Edge Computing Architecture for Mechanical Fault Diagnosis

Qingqing Huang, Yan Han, Jie Wang, Yan Zhang et al.
6 citations
IEEE Sensors Journal
Industrial Vision Systems and Defect Detection
2.09
article

MKD-SFasterNet: A Lightweight Edge Computing Architecture for Mechanical Fault Diagnosis

Qingqing Huang, Yan Han, Jie Wang, Yan Zhang, Xiaofeng Ouyang
article en
6 citations

Abstract

In the era of intelligent manufacturing, faced with the explosive growth of equipment and sensor data, deep learning (DL)-based fault diagnosis methods with significant feature extraction capabilities have been widely applied. However, as DL networks become increasingly complex, their computational and storage requirements increase, which poses a challenge for resource-constrained industrial scenarios. To address the problem, this study proposes a novel lightweight edge computing architecture, namely, multilevel knowledge distillation improved slim FasterNet (MKD-SFasterNet). First, the lightweight network FasterNet is optimized by using channel shuffle and group convolution to minimize the parameters and computational complexity of the model while improving the diagnostic accuracy. Second, the MKD method incorporates label decoupling and feature semantic information. It uses the gradient conflict elimination strategy to optimize the loss function, which further improves the diagnostic accuracy of the model without adding additional resources. Finally, the experiment was conducted using two mechanical fault datasets. The proposed method achieves the highest diagnostic accuracies of 94.95% and 94.25% compared to other lightweight networks, while the network’s number of parameters, floating-point calculations, and storage requirements are reduced by 98, 28, and 22 times compared to ResNet, respectively. Moreover, inference on edge devices takes only 4 ms, which proves its efficiency and superiority.

IEEE Sensors JournalVol. 24(20)
Chongqing University of Posts and Telecommunications (CN)
Openalex Percentile: Top 12%
Industrial Vision Systems and Defect Detection
2.09
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MKD-SFasterNet: A Lightweight Edge Computing Architecture for Mechanical Fault Diagnosis — Qingqing Huang, Yan Han, et al. · IEEE Sensors Journal (2024) | TGRS Research Map | TGRS