A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer
Porosifying the surface of a single crystalline silicon carbide (4H-SiC) wafer with the means of metal assisted photo chemical etching (MAPCE) promotes the adhesion of an electroplated nickel (Ni) layer. By utilizing a mechanical peel-off process, a Ni layer with tailored mechanical stress is peeled off such that also a thin layer of 4H-SiC is teared apart from the wafer as well.
Authors
- U. Schmid (ORCID: https://orcid.org/0000-0003-4528-8653)
- Georg Pfusterschmied (ORCID: https://orcid.org/0000-0003-3810-7770)
- Markus Leitgeb (ORCID: https://orcid.org/0000-0003-1609-4497)
- Shan Nizam Wahid
Institutions
- TU Wien (AT)
Publication Details
- Journal
- Materials science forum
- Published
- 2024-08-21
- DOI
- https://doi.org/10.4028/p-8aeonp
- Citations
- 2
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.42