A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer

Porosifying the surface of a single crystalline silicon carbide (4H-SiC) wafer with the means of metal assisted photo chemical etching (MAPCE) promotes the adhesion of an electroplated nickel (Ni) layer. By utilizing a mechanical peel-off process, a Ni layer with tailored mechanical stress is peeled off such that also a thin layer of 4H-SiC is teared apart from the wafer as well.

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Publication Details

Journal
Materials science forum
Published
2024-08-21
DOI
https://doi.org/10.4028/p-8aeonp
Citations
2
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.42
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article

A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer

U. Schmid, Georg Pfusterschmied, Markus Leitgeb, Shan Nizam Wahid
2 citations
Materials science forum
Silicon Carbide Semiconductor Technologies
0.42
article

A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer

U. Schmid, Georg Pfusterschmied, Markus Leitgeb, Shan Nizam Wahid
article en
2 citations

Abstract

Porosifying the surface of a single crystalline silicon carbide (4H-SiC) wafer with the means of metal assisted photo chemical etching (MAPCE) promotes the adhesion of an electroplated nickel (Ni) layer. By utilizing a mechanical peel-off process, a Ni layer with tailored mechanical stress is peeled off such that also a thin layer of 4H-SiC is teared apart from the wafer as well.

Materials science forumVol. 1124
TU Wien (AT)
Openalex Percentile: Top 38%
Silicon Carbide Semiconductor Technologies
0.42
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