Fabrication of Low Resistive and Adhesive Cu Layer on Glass Substrate by Chemical Bath Deposition and Chemical Reduction

The surface state of soda-lime glasses before and after ultrasonication pretreatments with water, acetone, ethanol, water/ethanol/NaOH solutions, and UV/O3 treatment were estimated using atomic force microscopy(AFM)and Fourier-transformed infrared spectroscopy with attenuated total reflection mode(FT-IR-ATR). Ultrasonication with water/ethanol/NaOH solutions and UV/O3 treatments drastically decreased the size and number of surface contaminant particles and enhanced absorption of the isolated silanol and hydrogen-terminated silanol. The Cu(OH)2/Cu(O,S)bilayers were prepared using chemical bath deposition(CBD)in aqueous solutions containing copper(II)nitrate hydrate, ammonium nitrate, and urea or thiourea on glass substrates treated with water/ethanol/NaOH solutions. Top metallic Cu layers were then formed chemically by simple immersion of the bilayers into a NaBH4 aqueous solution. The sheet resistance decreased with increasing immersion time, leading to 0.68 Ω/□ sheet resistance and 3.3×10−5 Ω cm resistivity after 10 min immersion. The adhesion strength was estimated using the tape peeling off test with a tensile testing machine and adhesion tape. The Cu/Cu(OH)2/Cu(O,S)bilayer fabricated by chemical reduction for 10 min exhibited maximum and average adhesion strengths of 13.3 N/cm and 11.0 N/cm, respectively. The adhesivity was inferred to have originated from hydrogen bonding between the oxygen ions in Cu(O,S)and -OH- in silanol of the glass substrate.

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Publication Details

Journal
Journal of The Surface Finishing Society of Japan
Published
2024-09-01
DOI
https://doi.org/10.4139/sfj.75.408
Citations
1
Primary Topic
Copper Interconnects and Reliability
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article
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0.12
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article

Fabrication of Low Resistive and Adhesive Cu Layer on Glass Substrate by Chemical Bath Deposition and Chemical Reduction

Kosuke IMAHORI, Khoo Pei Loon, Hisaya Takahashi, Naoyuki Fujita et al.
1 citations
Journal of The Surface Finishing Society of Japan
Copper Interconnects and Reliability
0.12
article

Fabrication of Low Resistive and Adhesive Cu Layer on Glass Substrate by Chemical Bath Deposition and Chemical Reduction

Kosuke IMAHORI, Khoo Pei Loon, Hisaya Takahashi, Naoyuki Fujita, Yui HASHIMOTO, Rieru INABA, Haruka KUWAHARA, Masanobu IZAKI
article en
1 citations

Abstract

The surface state of soda-lime glasses before and after ultrasonication pretreatments with water, acetone, ethanol, water/ethanol/NaOH solutions, and UV/O3 treatment were estimated using atomic force microscopy(AFM)and Fourier-transformed infrared spectroscopy with attenuated total reflection mode(FT-IR-ATR). Ultrasonication with water/ethanol/NaOH solutions and UV/O3 treatments drastically decreased the size and number of surface contaminant particles and enhanced absorption of the isolated silanol and hydrogen-terminated silanol. The Cu(OH)2/Cu(O,S)bilayers were prepared using chemical bath deposition(CBD)in aqueous solutions containing copper(II)nitrate hydrate, ammonium nitrate, and urea or thiourea on glass substrates treated with water/ethanol/NaOH solutions. Top metallic Cu layers were then formed chemically by simple immersion of the bilayers into a NaBH4 aqueous solution. The sheet resistance decreased with increasing immersion time, leading to 0.68 Ω/□ sheet resistance and 3.3×10−5 Ω cm resistivity after 10 min immersion. The adhesion strength was estimated using the tape peeling off test with a tensile testing machine and adhesion tape. The Cu/Cu(OH)2/Cu(O,S)bilayer fabricated by chemical reduction for 10 min exhibited maximum and average adhesion strengths of 13.3 N/cm and 11.0 N/cm, respectively. The adhesivity was inferred to have originated from hydrogen bonding between the oxygen ions in Cu(O,S)and -OH- in silanol of the glass substrate.

Journal of The Surface Finishing Society of JapanVol. 75(9)
SANE Mental Health Charity (GB), Toyohashi University of Technology (JP), National Institute of Technology, Nara College (JP), Nara Women's University (JP)
Openalex Percentile: Top 67%
Copper Interconnects and Reliability
0.12
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