Validation of the vertical canopy cover profile products derived from GEDI over selected forest sites

Canopy cover (CC) quantifies the proportion of canopy materials projected vertically onto the ground surface. CC is a crucial canopy structural variable and is commonly used in many ecological and climatic models. The vertical CC profile product is currently available from the Global Ecosystem Dynamics Investigation (GEDI). However, detailed information about the accuracy and uncertainty of the GEDI vertical CC profile product remains limited. The objective of this study is to validate the GEDI CC product over selected forest sites using reference values derived from digital hemispherical photography (DHP), airborne laser scanning (ALS) point clouds, and simulated waveforms. The accuracy of CC was quantified and analyzed regarding GEDI observation conditions, waveform processing, and estimation methods. The results show that the total GEDI CC correlates well with those estimated from DHP, ALS, and simulated waveform data (r2 = 0.65, 0.71, and 0.71, respectively) but is systematically underestimated (bias = −0.05, −0.11, and −0.07, respectively) based on reference data. Compared with the ALS-estimated CC, needleleaf forest shows the highest correlation for vertical CC (r2 ≥ 0.65) and shrubland shows the lowest bias for total CC (bias = −0.13). The mean absolute error (MAE) of the GEDI CC decreases from 0.15 to 0.09 from the ground to 35 m. The total GEDI CCs derived from the waveform interpretation algorithms A2 and A6 display the highest r2 (≥ 0.6) and smallest RMSE (≤ 0.23) compared to those of the other algorithms. The GEDI CC was improved at moderate CC values using a canopy-to-background backscattering coefficient ratio () determined with the regression method. The CC accuracy increases with beam sensitivity and decreases with increasing canopy cover. The partial difference between GEDI CC and ALS CC is attributed to definition differences. Further improvement of the CC algorithm can be made by using vegetation-specific waveform processing algorithms and realistic values.