Is the linear relationship between the slope and intercept observed in field emission S-K plots an artifact?
The performance of field emitters is usually analyzed by linear fitting of a Fowler–Nordheim plot. It has sometimes been observed that the fitted slopes and intercepts show a strong correlation, but no convincing explanation has been provided. We propose a simple model showing that this correlation is due to fluctuations in the slope and the fact that the experiments are carried out over a defined range of voltage and current. By performing a meta-analysis, we show that this explanation correctly predicts the results of other groups in this field.
Authors
- P. Poncharal (ORCID: https://orcid.org/0000-0002-9092-6864)
- A. Ayari (ORCID: https://orcid.org/0000-0003-1654-5470)
- Stephen T. Purcell (ORCID: https://orcid.org/0009-0000-3656-4703)
- S. Perisanu (ORCID: https://orcid.org/0000-0003-1408-2425)
- P. Vincent (ORCID: https://orcid.org/0000-0001-5405-9575)
Institutions
- Université Claude Bernard Lyon 1 (FR)
- Centre National de la Recherche Scientifique (FR)
- Institut Lumière Matière (FR)
Publication Details
- Journal
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Published
- 2024-08-30
- DOI
- https://doi.org/10.1116/6.0003828
- Citations
- 1
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- Agence Nationale de la Recherche