Formation conditions of the tungsten porous thin film with pulsed laser deposition under various gas atmosphere

Abstract Pulsed laser deposition (PLD) under gas atmospheres has been used to fabricate thin films for various applications. In this study, PLD was performed under various gas atmospheres (helium, oxygen, and argon) using tungsten (W) to investigate the morphology of thin films. Various types of structures were formed, including uniform, nanoparticles, and columnar structures. In particular, the substrate fabricated at an argon pressure of 100 Pa had a high porosity and a low light reflectance in the 200–1400 nm wavelength range. In addition, it was shown that the growth of the thin film thickness was non-linear with respect to time, and the formation of a fuzz-like structure may be influenced by particle diffusion in the gas phase and on the substrate.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2024-08-30
DOI
https://doi.org/10.35848/1347-4065/ad759a
Citations
5
Primary Topic
Advanced Materials Characterization Techniques
Type
article
Field-Weighted Citation Impact
0.92
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article

Formation conditions of the tungsten porous thin film with pulsed laser deposition under various gas atmosphere

Shin Kajita, Quan Shi, Shogo Kodate
5 citations
Japanese Journal of Applied Physics
Advanced Materials Characterization Techniques
0.92
article

Formation conditions of the tungsten porous thin film with pulsed laser deposition under various gas atmosphere

Shin Kajita, Quan Shi, Shogo Kodate
article en
5 citations

Abstract

Abstract Pulsed laser deposition (PLD) under gas atmospheres has been used to fabricate thin films for various applications. In this study, PLD was performed under various gas atmospheres (helium, oxygen, and argon) using tungsten (W) to investigate the morphology of thin films. Various types of structures were formed, including uniform, nanoparticles, and columnar structures. In particular, the substrate fabricated at an argon pressure of 100 Pa had a high porosity and a low light reflectance in the 200–1400 nm wavelength range. In addition, it was shown that the growth of the thin film thickness was non-linear with respect to time, and the formation of a fuzz-like structure may be influenced by particle diffusion in the gas phase and on the substrate.

Japanese Journal of Applied PhysicsVol. 63(9)
The University of Tokyo (JP)
Openalex Percentile: Top 28%
Advanced Materials Characterization Techniques
0.92
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