Accelerating Interface Science Through NREL's New Electron Microscopy Suite

Presentation on NREL's new capabilities in electron microscopy and AI-guided interface that are relevant to the Si PV community.

Authors

Publication Details

Journal
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Published
2024-08-16
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
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article

Accelerating Interface Science Through NREL's New Electron Microscopy Suite

Steven R. Spurgeon
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Electron and X-Ray Spectroscopy Techniques
article

Accelerating Interface Science Through NREL's New Electron Microscopy Suite

Steven R. Spurgeon
article en

Abstract

Presentation on NREL's new capabilities in electron microscopy and AI-guided interface that are relevant to the Si PV community.

OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Electron and X-Ray Spectroscopy Techniques
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Accelerating Interface Science Through NREL's New Electron Microscopy Suite — Steven R. Spurgeon · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (2024) | TGRS Research Map | TGRS