Topological Insulator Based Polarization Sensitive Detection
Polarimetric sensors offer advanced information about an image beyond traditional intensity-based imagers. Topological insulators have inherent properties that allow polarization sensitive detection across a large spectral range without the need for bulky optics. We present a Bi<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>Se<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>-based single pixel detector that demonstrates polarization sensitive photocurrents.
Authors
- Owen Vail (ORCID: https://orcid.org/0000-0001-9349-7746)
- Eunice Paik
- George J. de Coster (ORCID: https://orcid.org/0000-0003-4751-8256)
- Blair C. Connelly
- Patrick J. Taylor (ORCID: https://orcid.org/0009-0003-6511-6442)
Institutions
- DEVCOM Army Research Laboratory (US)
- United States Army Combat Capabilities Development Command (US)
Publication Details
- Published
- 2024-08-14
- DOI
- https://doi.org/10.1109/rapid60772.2024.10646927
- Primary Topic
- Optical Polarization and Ellipsometry
- Type
- article
- Field-Weighted Citation Impact
- 0.00