Defect Rate Prediction in Manufacturing Process Using K-Nearest Neighbor Algorithm

The efficiency and effectiveness in the manufacturing industry are significantly impacted by artificial intelligence technology. An important application involves the improvement of product quality, which is measurable through the defects occurring during the production process. This research is aimed at predicting defects in the manufacturing process using the K-Nearest Neighbor (KNN) algorithm with various distance measurement methods, namely Euclidean, Minkowski, and Manhattan distances. The research methodology is composed of four stages: dataset collection, data preprocessing, modeling, and evaluation. The focus of this research is on the optimal K value and the conditions that yield the highest accuracy, considering various scenarios of training and test data splitting ratios and different random state values. The test results indicate that the Minkowski distance method, with a data division ratio of 80% for training data, 20% for test data, and a random state value of 32, provides the best performance, with an optimal K value of 10 and an accuracy of 86.41%.