Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL
Xray free-electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X-ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing-incidence FEL mirror can withstand. To address this issue, several studies were conducted on grazing-incidence damage by soft X-ray FEL pulses at the European XFEL facility. Boron carbide (B<sub>4</sub>C) coatings on polished silicon substrate were investigated using 1 keV photon energy, similar to the X-ray mirrors currently installed at the soft X-ray beamlines (SASE3). The purpose of this study is to compare the damage threshold of B<sub>4</sub>C and Si to determine the advantages, tolerance and limits of using B<sub>4</sub>C coatings.
Authors
- Vojtěch Vozda (ORCID: https://orcid.org/0000-0002-5426-1519)
- J. Chalupský (ORCID: https://orcid.org/0000-0001-6930-1774)
- W. Hillert (ORCID: https://orcid.org/0000-0002-2762-5954)
- Harald Sinn (ORCID: https://orcid.org/0000-0001-7546-1870)
- V. Hájková (ORCID: https://orcid.org/0000-0002-0776-6012)
- Mikako Makita (ORCID: https://orcid.org/0000-0003-1513-9198)
- L. Juha (ORCID: https://orcid.org/0000-0003-4189-8753)
- Maurizio Vannoni (ORCID: https://orcid.org/0000-0002-2768-4559)
- Šimon Jelínek (ORCID: https://orcid.org/0000-0002-1999-811X)
- Marziyeh Tavakkoly
- J. Montaño (ORCID: https://orcid.org/0000-0001-6735-3394)
- Michael Meyer (ORCID: https://orcid.org/0000-0002-1444-6770)
- Tommaso Mazza (ORCID: https://orcid.org/0000-0003-3105-459X)
Institutions
- Universität Hamburg (DE)
- Czech Academy of Sciences (CZ)
- Charles University (CZ)
- Deutsches Elektronen-Synchrotron DESY (DE)
- Czech Academy of Sciences, Institute of Plasma Physics (CZ)
- FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ)
- Institute of Physics of the Slovak Academy of Sciences (SK)
- European X-Ray Free-Electron Laser (DE)
Publication Details
- Journal
- Journal of Synchrotron Radiation
- Published
- 2024-08-25
- DOI
- https://doi.org/10.1107/s1600577524007318
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Helmholtz-Gemeinschaft
- Ministerstvo Školství, Mládeže a Tělovýchovy
- Deutsches Elektronen-Synchrotron