Floating Island Structure With Metal Bridge to Resolve the Turn-On Recovery Problem
The floating Island (FI) device has a severe turn-on recovery problem. In this brief, a new “metal bridge” that connects the Island and the N+ buffer through ohmic contact is proposed. The objective of the new structure is to resolve the turn-on recovery problem. Simulations are conducted to validate the efficacy of the structure. The proposed FI junction barrier Schottky with the proposed metal bridge (MB-FIJBS) shows no voltage overshoot and has significantly reduced the recovered on-state voltage compared to the conventional junction barrier Schottky (Conv. JBS). The recovered on-state voltage of the MB-FIJBS is the same as its static On-state voltage, proving a complete recovery. The mechanism of the turn-on process of the MB-FIJBS is elucidated. The MB-FIJBS achieves rapid recovery by completely removing any additional potential barrier in the current flow path. The MB-FIJBS is well designed, so that it does not degrade the breakdown voltage (BV). The 3-D implementation of the MB-FIJBS is proposed to provide a practically feasible structure that is compatible with the current manufacturing process. A simulation of the 3-D structure has been conducted to validate its effectiveness.
Authors
- Kuang Sheng (ORCID: https://orcid.org/0000-0001-8839-7281)
- Ce Wang (ORCID: https://orcid.org/0000-0002-6346-1168)
- Hengyu Wang (ORCID: https://orcid.org/0000-0002-9193-2131)
Institutions
- Zhejiang University (CN)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2024-08-26
- DOI
- https://doi.org/10.1109/ted.2024.3438102
- Citations
- 3
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- Key Research and Development Program of Liaoning Province