Floating Island Structure With Metal Bridge to Resolve the Turn-On Recovery Problem

The floating Island (FI) device has a severe turn-on recovery problem. In this brief, a new “metal bridge” that connects the Island and the N+ buffer through ohmic contact is proposed. The objective of the new structure is to resolve the turn-on recovery problem. Simulations are conducted to validate the efficacy of the structure. The proposed FI junction barrier Schottky with the proposed metal bridge (MB-FIJBS) shows no voltage overshoot and has significantly reduced the recovered on-state voltage compared to the conventional junction barrier Schottky (Conv. JBS). The recovered on-state voltage of the MB-FIJBS is the same as its static On-state voltage, proving a complete recovery. The mechanism of the turn-on process of the MB-FIJBS is elucidated. The MB-FIJBS achieves rapid recovery by completely removing any additional potential barrier in the current flow path. The MB-FIJBS is well designed, so that it does not degrade the breakdown voltage (BV). The 3-D implementation of the MB-FIJBS is proposed to provide a practically feasible structure that is compatible with the current manufacturing process. A simulation of the 3-D structure has been conducted to validate its effectiveness.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-08-26
DOI
https://doi.org/10.1109/ted.2024.3438102
Citations
3
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.63

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article

Floating Island Structure With Metal Bridge to Resolve the Turn-On Recovery Problem

Kuang Sheng, Ce Wang, Hengyu Wang
3 citations
IEEE Transactions on Electron Devices
Silicon Carbide Semiconductor Technologies
0.63
article

Floating Island Structure With Metal Bridge to Resolve the Turn-On Recovery Problem

Kuang Sheng, Ce Wang, Hengyu Wang
article en
3 citations

Abstract

The floating Island (FI) device has a severe turn-on recovery problem. In this brief, a new “metal bridge” that connects the Island and the N+ buffer through ohmic contact is proposed. The objective of the new structure is to resolve the turn-on recovery problem. Simulations are conducted to validate the efficacy of the structure. The proposed FI junction barrier Schottky with the proposed metal bridge (MB-FIJBS) shows no voltage overshoot and has significantly reduced the recovered on-state voltage compared to the conventional junction barrier Schottky (Conv. JBS). The recovered on-state voltage of the MB-FIJBS is the same as its static On-state voltage, proving a complete recovery. The mechanism of the turn-on process of the MB-FIJBS is elucidated. The MB-FIJBS achieves rapid recovery by completely removing any additional potential barrier in the current flow path. The MB-FIJBS is well designed, so that it does not degrade the breakdown voltage (BV). The 3-D implementation of the MB-FIJBS is proposed to provide a practically feasible structure that is compatible with the current manufacturing process. A simulation of the 3-D structure has been conducted to validate its effectiveness.

IEEE Transactions on Electron DevicesVol. 71(10)
Zhejiang University (CN)
Key Research and Development Program of Liaoning Province
Openalex Percentile: Top 32%
Silicon Carbide Semiconductor Technologies
0.63
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Floating Island Structure With Metal Bridge to Resolve the Turn-On Recovery Problem — Kuang Sheng, Ce Wang, et al. · IEEE Transactions on Electron Devices (2024) | TGRS Research Map | TGRS