Normally-Off 1200V Silicon Carbide JFET Diode with Low V<sub>F</sub>

Novel diode structure which looks like DMOSFETs with the gate-shorted to n + source has been developed for the first time. The lateral JFET channel as a built-in channel instead of gate oxide is integrated and it is pinched-off under the zero bias condition. As JFET diode decreases the forward voltage drop using JFET channel efficiency rather than the cell pitch reduction or the increase of doping concentration in n-SiC drift region, V F and capacitive charges which have a trade-off relationship typically could be decreased simultaneously and a better switching performance is also expected accordingly. Figure-of-Merit (=V F ×Q C ) of the proposed JFET diode has been improved by 20.2% in average compared to that of JBS diode and this FOM would be the best in class among 1200V SiC diode products.

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Publication Details

Journal
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Published
2024-08-23
DOI
https://doi.org/10.4028/p-7g7jdc
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
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article

Normally-Off 1200V Silicon Carbide JFET Diode with Low VF

Yeon Jeong Kim, Chang Joon Park, Kevin Kyu Heon Cho, Fredrik Allerstam et al.
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Silicon Carbide Semiconductor Technologies
article

Normally-Off 1200V Silicon Carbide JFET Diode with Low VF

Yeon Jeong Kim, Chang Joon Park, Kevin Kyu Heon Cho, Fredrik Allerstam, Kyeong Seok Park
article en

Abstract

Novel diode structure which looks like DMOSFETs with the gate-shorted to n + source has been developed for the first time. The lateral JFET channel as a built-in channel instead of gate oxide is integrated and it is pinched-off under the zero bias condition. As JFET diode decreases the forward voltage drop using JFET channel efficiency rather than the cell pitch reduction or the increase of doping concentration in n-SiC drift region, V F and capacitive charges which have a trade-off relationship typically could be decreased simultaneously and a better switching performance is also expected accordingly. Figure-of-Merit (=V F ×Q C ) of the proposed JFET diode has been improved by 20.2% in average compared to that of JBS diode and this FOM would be the best in class among 1200V SiC diode products.

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenaVol. 360
ON Semiconductor (United States) (US), AKHAN Semiconductor (United States)
Industry, innovation and infrastructure
Openalex Percentile: Top 89%
Silicon Carbide Semiconductor Technologies
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