Comparative Performance Evaluation of High-Voltage Bidirectional, Conventional and Superjunction Planar DMOSFETs in 4H-SiC
We quantitively compare the static and dynamic performance for high-voltage SiC bidirectional (BD) conventional and superjunction (SJ) DMOSFETs by using 3D TCAD simulations. We extract the specific on-resistance (R ON,sp ) and the total specific switching charge (Q T,sp ), which is a sum of the specific gate charge (Q G,sp ) and drain charge (Q DS,sp ) to quantify both the static and switching characteristics respectively. We also develop a new Figure-of-Merit (FoM), which is the product of R ON,sp . Q T,sp , to evaluate the overall performance. We show that the high-voltage 4H-SiC BD SJ DMOSFET has the best FoM with substantial (>58%) improvement, compared to the BD conventional DMOSFETs, which increases with increasing breakdown voltage.
Authors
- Mohamed Torky (ORCID: https://orcid.org/0000-0002-9580-7661)
- T. Paul Chow (ORCID: https://orcid.org/0000-0002-1078-1707)
Institutions
- Rensselaer Polytechnic Institute (US)
Publication Details
- Journal
- Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
- Published
- 2024-08-23
- DOI
- https://doi.org/10.4028/p-w1i4ee
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00