Comparative Performance Evaluation of High-Voltage Bidirectional, Conventional and Superjunction Planar DMOSFETs in 4H-SiC

We quantitively compare the static and dynamic performance for high-voltage SiC bidirectional (BD) conventional and superjunction (SJ) DMOSFETs by using 3D TCAD simulations. We extract the specific on-resistance (R ON,sp ) and the total specific switching charge (Q T,sp ), which is a sum of the specific gate charge (Q G,sp ) and drain charge (Q DS,sp ) to quantify both the static and switching characteristics respectively. We also develop a new Figure-of-Merit (FoM), which is the product of R ON,sp . Q T,sp , to evaluate the overall performance. We show that the high-voltage 4H-SiC BD SJ DMOSFET has the best FoM with substantial (>58%) improvement, compared to the BD conventional DMOSFETs, which increases with increasing breakdown voltage.

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Journal
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Published
2024-08-23
DOI
https://doi.org/10.4028/p-w1i4ee
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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article

Comparative Performance Evaluation of High-Voltage Bidirectional, Conventional and Superjunction Planar DMOSFETs in 4H-SiC

Mohamed Torky, T. Paul Chow
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Silicon Carbide Semiconductor Technologies
article

Comparative Performance Evaluation of High-Voltage Bidirectional, Conventional and Superjunction Planar DMOSFETs in 4H-SiC

Mohamed Torky, T. Paul Chow
article en

Abstract

We quantitively compare the static and dynamic performance for high-voltage SiC bidirectional (BD) conventional and superjunction (SJ) DMOSFETs by using 3D TCAD simulations. We extract the specific on-resistance (R ON,sp ) and the total specific switching charge (Q T,sp ), which is a sum of the specific gate charge (Q G,sp ) and drain charge (Q DS,sp ) to quantify both the static and switching characteristics respectively. We also develop a new Figure-of-Merit (FoM), which is the product of R ON,sp . Q T,sp , to evaluate the overall performance. We show that the high-voltage 4H-SiC BD SJ DMOSFET has the best FoM with substantial (>58%) improvement, compared to the BD conventional DMOSFETs, which increases with increasing breakdown voltage.

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenaVol. 360
Rensselaer Polytechnic Institute (US)
Affordable and clean energy
Openalex Percentile: Top 89%
Silicon Carbide Semiconductor Technologies
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