Analytical Modelling of the Quasi-Static Operation of a Monolithically Integrated 4H-SiC Circuit Breaker Device

In this work, an analytical model describing the quasi-static operation of a monolithically integrated SiC solid-state circuit breaker (SSCB) device is rederived and refined. This SSCB is based on a 4H-SiC JFET technology offering a self-sensed blocking mechanism. The proposed model is solely based on physical parameters including the SSCB design parameters. With respect to the refinement, the proposed model is not limited to one-sided pn-junctions, considers incomplete ionization of dopants, and is able to represent breakdown characteristics. In this regard, the JFET gate breakdown characteristics are derived taking thermionic emission, space-charge-limited current and impact ionization into account. To calculate the SSCB output characteristics, a bisection-based optimization algorithm is applied carefully considering individual JFET operating states.

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Publication Details

Journal
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Published
2024-08-23
DOI
https://doi.org/10.4028/p-ekvc4b
Citations
1
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.21
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article

Analytical Modelling of the Quasi-Static Operation of a Monolithically Integrated 4H-SiC Circuit Breaker Device

Norman Boettcher, Mathias Rommel, Johann Tobias Erlbacher
1 citations
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Silicon Carbide Semiconductor Technologies
0.21
article

Analytical Modelling of the Quasi-Static Operation of a Monolithically Integrated 4H-SiC Circuit Breaker Device

Norman Boettcher, Mathias Rommel, Johann Tobias Erlbacher
article en
1 citations

Abstract

In this work, an analytical model describing the quasi-static operation of a monolithically integrated SiC solid-state circuit breaker (SSCB) device is rederived and refined. This SSCB is based on a 4H-SiC JFET technology offering a self-sensed blocking mechanism. The proposed model is solely based on physical parameters including the SSCB design parameters. With respect to the refinement, the proposed model is not limited to one-sided pn-junctions, considers incomplete ionization of dopants, and is able to represent breakdown characteristics. In this regard, the JFET gate breakdown characteristics are derived taking thermionic emission, space-charge-limited current and impact ionization into account. To calculate the SSCB output characteristics, a bisection-based optimization algorithm is applied carefully considering individual JFET operating states.

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenaVol. 360
Schott (Germany) (DE), Friedrich-Alexander-Universität Erlangen-Nürnberg (DE), Fraunhofer Institute for Integrated Systems and Device Technology (DE)
Affordable and clean energy
Openalex Percentile: Top 49%
Silicon Carbide Semiconductor Technologies
0.21
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