High-Speed and High-Temperature Switching Operations of a SiC Power MOSFET Using a SiC CMOS Gate Driver Installed inside a Power Module
In this study, the simultaneous realization of high-speed and high-temperature switching operations is demonstrated using a custom-made high-speed and high-temperature power module installed with a silicon carbide (SiC) CMOS gate driver, which can reduce gate loop inductance and operate at high temperatures. Approximate switching speeds of 70 and 60 V/ns are achieved during the turn-on and turn-off operations, respectively, at 300°C, 600 V DC bus voltage, and 20 A load current using the developed module. The switching speed remained above 50 V/ns in the temperature range from room temperature to 300°C. Numerical calculations based on the static properties of the SiC power MOSFET and CMOS gate driver can predict the actual switching properties over a wide temperature range when the developed module incorporating the fabricated SiC CMOS gate driver is used.
Authors
- Hiroshi Hozoji
- Shinji Sato (ORCID: https://orcid.org/0000-0002-7888-2117)
- Mitsuo Okamoto (ORCID: https://orcid.org/0000-0003-3261-8705)
- Takashi Ando (ORCID: https://orcid.org/0000-0002-1097-818X)
- Hiroshi Sato (ORCID: https://orcid.org/0000-0001-9285-1635)
- Fumiki Kato (ORCID: https://orcid.org/0000-0001-7877-1567)
- Shinsuke Harada (ORCID: https://orcid.org/0000-0002-0053-4606)
- Daiki Yamaguchi (ORCID: https://orcid.org/0000-0001-7226-7482)
- Atsushi Yao (ORCID: https://orcid.org/0000-0002-4968-068X)
Institutions
- National Institute of Advanced Industrial Science and Technology (JP)
Publication Details
- Journal
- Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
- Published
- 2024-08-23
- DOI
- https://doi.org/10.4028/p-4sivse
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Japan Society for the Promotion of Science