3D‐Mapping and Manipulation of Photocurrent in an Optoelectronic Diamond Device

Establishing connections between material impurities and charge transport properties in emerging electronic and quantum materials, such as wide-bandgap semiconductors, demands new diagnostic methods tailored to these unique systems. Many such materials host optically-active defect centers which offer a powerful in situ characterization system, but one that typically relies on the weak spin-electric field coupling to measure electronic phenomena. In this work, charge-state sensitive optical microscopy is combined with photoelectric detection of an array of nitrogen-vacancy (NV) centers to directly image the flow of charge carriers inside a diamond optoelectronic device, in 3D and with temporal resolution. Optical control is used to change the charge state of background impurities inside the diamond on-demand, resulting in drastically different current flow such as filamentary channels nucleating from specific, defective regions of the device. Conducting channels that control carrier flow, key steps toward optically reconfigurable, wide-bandgap optoelectronics are then engineered using light. This work might be extended to probe other wide-bandgap semiconductors (SiC, GaN) relevant to present and emerging electronic and quantum technologies.

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Publication Details

Journal
Advanced Materials
Published
2024-08-23
DOI
https://doi.org/10.1002/adma.202405338
Citations
6
Primary Topic
Diamond and Carbon-based Materials Research
Type
article
Field-Weighted Citation Impact
0.70

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article

3D‐Mapping and Manipulation of Photocurrent in an Optoelectronic Diamond Device

Carlos A. Meriles, C. T.-K. Lew, Nikolai Dontschuk, R. M. Goldblatt et al.
6 citations
Advanced Materials
Diamond and Carbon-based Materials Research
0.70
article

3D‐Mapping and Manipulation of Photocurrent in an Optoelectronic Diamond Device

Carlos A. Meriles, C. T.-K. Lew, Nikolai Dontschuk, R. M. Goldblatt, David A. Broadway, Jean‐Philippe Tetienne, Artur Lozovoi, Daniel J. McCloskey, A. A. Wood, Tom Delord, Brett C. Johnson, A. Martin, Kaih T. Mitchell
article en
6 citations

Abstract

Establishing connections between material impurities and charge transport properties in emerging electronic and quantum materials, such as wide-bandgap semiconductors, demands new diagnostic methods tailored to these unique systems. Many such materials host optically-active defect centers which offer a powerful in situ characterization system, but one that typically relies on the weak spin-electric field coupling to measure electronic phenomena. In this work, charge-state sensitive optical microscopy is combined with photoelectric detection of an array of nitrogen-vacancy (NV) centers to directly image the flow of charge carriers inside a diamond optoelectronic device, in 3D and with temporal resolution. Optical control is used to change the charge state of background impurities inside the diamond on-demand, resulting in drastically different current flow such as filamentary channels nucleating from specific, defective regions of the device. Conducting channels that control carrier flow, key steps toward optically reconfigurable, wide-bandgap optoelectronics are then engineered using light. This work might be extended to probe other wide-bandgap semiconductors (SiC, GaN) relevant to present and emerging electronic and quantum technologies.

Advanced MaterialsVol. 36(40)
The Graduate Center, CUNY (US), City College of New York (US), The University of Melbourne (AU), RMIT University (AU)
National Science Foundation, U.S. Department of Energy, Australian Government, University of Melbourne, Office of Science, Australian Research Council, Core Research for Evolutional Science and Technology
Openalex Percentile: Top 30%
Diamond and Carbon-based Materials Research
0.70
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