Introducing a Controlled Interfacial Layer to Enhance the Template Effect of ZrO₂ in the ZrO₂/HfO₂/ZrO₂ Structure

A novel approach using a controlled interfacial layer (CIL) to modulate HfO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> thin film crystallization in ZrO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>/HfO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>/ZrO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> (ZHZ) structures was investigated. Through X-ray diffraction and high-resolution transmission electron microscopy, the CIL suppresses undesired monoclinic phases in HfO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>, favoring the desired tetragonal phase for high dielectric constants. Precise control of HfO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> thickness via CIL maintains constant dielectric constants across ZHZ structures, addressing challenges of fluctuating constants. This study highlights CIL’s potential in tailored ZrO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>/HfO<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> engineering for electronics, providing insights into crystallization behavior and paving the way for advanced device applications.