Current Kink Effect in <i>β</i>-Ga₂O₃ MOSFETs Induced by Incomplete Ionization of Donors
In this article, the origin of severe drain–source current kink effect in <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>O<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> MOSFETs has been exploited by means of temperature- and pulse-dependent current–voltage (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I</i>–<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i>) analysis. By reducing the pulse biasing widths, whereby the self-heating effect was negligible, the output characteristics were free of kink but with a rather low drain–source current density (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {DS}}$ </tex-math></inline-formula>) at a high drain voltage (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {DS}}$ </tex-math></inline-formula>) of 30 V. The current kink effect started to occur with a direct-current power consumption of approximately 850 mW/mm. The elimination of kink features was also observed together with a large <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {DS}}$ </tex-math></inline-formula> at elevated temperatures over 100 °C. These observations indicate that the kink effect is strongly related to thermal activation of incomplete ionized donors by either the self-heating effect or external intentional heating stress rather than high electric field. In terms of temperature-dependent current output characteristics, the thermal activation energy is determined to be 136 meV, which is consistent with the reported unintentional donors with a high activation energy of 110 meV. It implies that additional electrons are thermally activated and emitted from the incomplete ionized donors in <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>O<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> channel or buffer layers through the self-heating effect, contributing to the channel conductivity modulation and the consequent current kink effect. These findings may bridge the knowledge gap between charge transport mechanisms and the reliability degradation of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>O<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> power switches.
Authors
- Dunjun Chen (ORCID: https://orcid.org/0000-0002-1363-1413)
- Hehe Gong (ORCID: https://orcid.org/0000-0002-0442-3057)
- Xinxin Yu (ORCID: https://orcid.org/0000-0003-0898-8837)
- Zhenghao Shen (ORCID: https://orcid.org/0000-0002-0514-0665)
- Yuechan Kong (ORCID: https://orcid.org/0000-0001-8968-2615)
- Shulin Gu (ORCID: https://orcid.org/0000-0001-9322-5978)
- Xin Ou (ORCID: https://orcid.org/0000-0002-0316-9958)
- Zhonghui Li (ORCID: https://orcid.org/0000-0002-7835-498X)
- Jianjun Zhou (ORCID: https://orcid.org/0000-0001-9898-7285)
- Rong Zhang (ORCID: https://orcid.org/0000-0003-0015-6331)
- Fangfang Ren (ORCID: https://orcid.org/0000-0001-5598-9512)
- Jiandong Ye (ORCID: https://orcid.org/0000-0002-3985-6768)
- Tangsheng Chen
- Youdou Zheng
Institutions
- Shanghai Institute of Microsystem and Information Technology (CN)
- Nanjing University (CN)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2024-08-23
- DOI
- https://doi.org/10.1109/ted.2024.3440950
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China