Orbital angular momentum beam-based interferometry for an in-plane displacement measurement

In this Letter, a novel, to the best of our knowledge, robust interferometry based on orbital angular momentum (OAM) is proposed for an in-plane displacement measurement. A vortex beam (VB) is incident onto a diffraction grating, and the ±1st order diffraction beams with conjugate OAM interfere with each other. By demodulating the petal-like interferogram, the in-plane displacement of the grating can be determined. Theoretically, a 1° rotation of the interferogram corresponds to a displacement of 2.31 nm. Experimental results revealed that the maximum measurement error was less than 3.35%. The proposed measurement system combines the advantages of both OAM interferometry and grating interferometry. It adopts the grating pitch instead of the wavelength as the measurement reference, providing robust immunity to environmental disturbances while maintaining high resolution simultaneously.

Authors

Publication Details

Journal
Optics Letters
Published
2024-08-23
DOI
https://doi.org/10.1364/ol.537121
Citations
5
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
1.25

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Orbital angular momentum beam-based interferometry for an in-plane displacement measurement

Hua Zhao, Y.R Wang, Huali Lu, Dongmei Guo, Zhanwu Xie, Wei Xia, Ming Wang, Ruiqian Sun
article en
5 citations

Abstract

In this Letter, a novel, to the best of our knowledge, robust interferometry based on orbital angular momentum (OAM) is proposed for an in-plane displacement measurement. A vortex beam (VB) is incident onto a diffraction grating, and the ±1st order diffraction beams with conjugate OAM interfere with each other. By demodulating the petal-like interferogram, the in-plane displacement of the grating can be determined. Theoretically, a 1° rotation of the interferogram corresponds to a displacement of 2.31 nm. Experimental results revealed that the maximum measurement error was less than 3.35%. The proposed measurement system combines the advantages of both OAM interferometry and grating interferometry. It adopts the grating pitch instead of the wavelength as the measurement reference, providing robust immunity to environmental disturbances while maintaining high resolution simultaneously.

Optics LettersVol. 49(18)
National Natural Science Foundation of China
Affordable and clean energy
Openalex Percentile: Top 19%
Optical measurement and interference techniques
1.25
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