A multi-release reliability model of open source software with fault detection obeying three-parameter lifetime distribution

With the development of open source software (OSS), software reliability has become an important issue. Due to the complexity of OSS development and testing environment, the fault detection rate of OSS will show a variety of changes. The existing OSS reliability models cannot fully adapt to the complex changes of OSS fault detection. In this paper, we proposed a multi-release OSS reliability model based on three-parameter lifetime distribution. The proposed model can effectively adapt to the complicated changes of fault detection in the processes of development and testing of OSS. Experimental results indicate that the proposed model has the better fitting and predictive performance compared with other multi-release OSS reliability models. Moreover, the proposed model can better adapt to the variety of OSS fault detection environment, and assist developers to evaluate the reliability of OSS.

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Publication Details

Journal
Scientific Reports
Published
2024-08-23
DOI
https://doi.org/10.1038/s41598-024-70536-x
Citations
2
Primary Topic
Software Reliability and Analysis Research
Type
article
Field-Weighted Citation Impact
0.97

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article

A multi-release reliability model of open source software with fault detection obeying three-parameter lifetime distribution

Ce Zhang, Jiaxuan Hu, Pengda Li, Jinyong Wang
2 citations
Scientific Reports
Software Reliability and Analysis Research
0.97
article

A multi-release reliability model of open source software with fault detection obeying three-parameter lifetime distribution

Ce Zhang, Jiaxuan Hu, Pengda Li, Jinyong Wang
article en
2 citations

Abstract

With the development of open source software (OSS), software reliability has become an important issue. Due to the complexity of OSS development and testing environment, the fault detection rate of OSS will show a variety of changes. The existing OSS reliability models cannot fully adapt to the complex changes of OSS fault detection. In this paper, we proposed a multi-release OSS reliability model based on three-parameter lifetime distribution. The proposed model can effectively adapt to the complicated changes of fault detection in the processes of development and testing of OSS. Experimental results indicate that the proposed model has the better fitting and predictive performance compared with other multi-release OSS reliability models. Moreover, the proposed model can better adapt to the variety of OSS fault detection environment, and assist developers to evaluate the reliability of OSS.

Scientific ReportsVol. 14(1)
Shanxi University (CN), Harbin Institute of Technology (CN)
Natural Science Foundation of Shandong Province, Division of Graduate Education
Openalex Percentile: Top 22%
Software Reliability and Analysis Research
0.97
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