Atomic Layer Deposition Films for Resistive Random‐Access Memories (Adv. Mater. Technol. 16/2024)
Atomic Layer Deposition Films Resistive random-access memory (RRAM) is a promising technology because of its ease of operation, high speed, affordability, and stability, particularly at nanoscale device sizes. In article number 2301762, Robert Zierold an o-workers show that atomic layer deposition is ideal for RRAM fabrication due to its ability to control oxygen vacancies and enables multiple-layer stacking, with potential applications in information storage and neural networks.
Authors
- Robert Zierold (ORCID: https://orcid.org/0000-0003-0292-0970)
- Chunxue Hao (ORCID: https://orcid.org/0000-0003-3631-440X)
- Jun Peng (ORCID: https://orcid.org/0009-0008-6282-3762)
- Robert H. Blick (ORCID: https://orcid.org/0000-0002-3602-7702)
Institutions
- Universität Hamburg (DE)
Publication Details
- Journal
- Advanced Materials Technologies
- Published
- 2024-08-01
- DOI
- https://doi.org/10.1002/admt.202470074
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.00