Stray light analysis of the optical chamber at the PANTER X-ray test facility

Accurate characterization and control of stray light are crucial in ensuring the precision and reliability of the test facilities. This paper focuses on the comprehensive stray light analysis conducted on the optical chamber at the PANTER test facility. Employing simulation tools and observation results, the study investigates the potential sources and pathways of stray light within the optical chamber, which possibly interferes with the performance verification of the X-ray optics. Results from the study provide valuable insights into the stray light environment within the PANTER optical chamber, aiding in the optimization of testing conditions and contributing to the broader understanding of maintaining precision in optical measurements. This work is essential for enhancing the overall performance and reliability of future measurement campaigns.

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Published
2024-08-21
DOI
https://doi.org/10.1117/12.3020028
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Stray light analysis of the optical chamber at the PANTER X-ray test facility

Gisela Hartner, Surangkhana Rukdee, Thomas Müller, V. Burwitz et al.
Advanced X-ray Imaging Techniques
article

Stray light analysis of the optical chamber at the PANTER X-ray test facility

Gisela Hartner, Surangkhana Rukdee, Thomas Müller, V. Burwitz, Thomas Schmidt
article en

Abstract

Accurate characterization and control of stray light are crucial in ensuring the precision and reliability of the test facilities. This paper focuses on the comprehensive stray light analysis conducted on the optical chamber at the PANTER test facility. Employing simulation tools and observation results, the study investigates the potential sources and pathways of stray light within the optical chamber, which possibly interferes with the performance verification of the X-ray optics. Results from the study provide valuable insights into the stray light environment within the PANTER optical chamber, aiding in the optimization of testing conditions and contributing to the broader understanding of maintaining precision in optical measurements. This work is essential for enhancing the overall performance and reliability of future measurement campaigns.

Vol. 11119
Max Planck Institute for Extraterrestrial Physics (DE)
Openalex Percentile: Top 86%
Advanced X-ray Imaging Techniques
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